Publications

Found 468 results
Author Title [ Type(Asc)] Year
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Book Chapter
Gimzewski, J. K. et al. Near Field Optics 333–340 (Springer Netherlands, 1993).
Gimzewski, J. K. et al. Near Field Optics 333–340 (Springer Netherlands, 1993).
Meyer, E. et al. Impact of Electron and Scanning Probe Microscopy on Materials Research 339–357 (Springer Netherlands, 1999).
Meyer, E. et al. Impact of Electron and Scanning Probe Microscopy on Materials Research 339–357 (Springer Netherlands, 1999).
Fabian, J. - H. et al. Micro Total Analysis Systems’ 9 117–120 (Springer Netherlands, 1998).
Fabian, J. - H. et al. Micro Total Analysis Systems’ 9 117–120 (Springer Netherlands, 1998).
Fabian, J. - H. et al. Micro Total Analysis Systems’ 9 117–120 (Springer Netherlands, 1998).
Gimzewski, J. K., Gerber, C., Meyer, E. & Schlittler, R. R. Forces in Scanning Probe Methods 123–131 (Springer Netherlands, 1995).
Gimzewski, J. K., Gerber, C., Meyer, E. & Schlittler, R. R. Forces in Scanning Probe Methods 123–131 (Springer Netherlands, 1995).
Meyer, E., Gimzewski, J. K., Gerber, C. & Schlittler, R. R. Ultimate Limits of Fabrication and Measurement 89–95 (Springer Netherlands, 1995).
Meyer, E., Gimzewski, J. K., Gerber, C. & Schlittler, R. R. Ultimate Limits of Fabrication and Measurement 89–95 (Springer Netherlands, 1995).
Gimzewski, J. K., Jung, T., Cuberes, M. T., Schlittler, R. R. & Joachim, C. Micro/Nanotribology and Its Applications 299–309 (Springer Netherlands, 1997).
Gimzewski, J. K., Berndt, R. & Schlittler, R. R. Nanosources and Manipulation of Atoms Under High Fields and Temperatures: Applications 219–228 (Springer Netherlands, 1993).
Lang, H. P. et al. Micro Total Analysis Systems’ 9 57–60 (Springer Netherlands, 1998).
Jung, T. A., Himpsel, F. J., Schlittler, R. R. & Gimzewski, J. K. Scanning Probe Microscopy 11–48 (Springer Berlin Heidelberg, 1998).
Berndt, R. & Gimzewski, J. K. Atomic and Nanometer-Scale Modification of Materials: Fundamentals and Applications 327–335 (Springer Netherlands, 1993).
Murray, P. W. et al. Ultimate Limits of Fabrication and Measurement 189–196 (Springer Netherlands, 1995).
Book
Welland, M. E. & Gimzewski, J. K. Ultimate limits of fabrication and measurement. (Kluwer Academic, 1995).

Pages