Publications

Found 44 results
Author Title [ Type(Desc)] Year
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Book Chapter
Dumas, P. et al. Optical Properties of Low Dimensional Silicon Structures 157–162 (Springer Netherlands, 1993).
Berger, R. et al. Sensor Technology in the Netherlands: State of the Art 33–42 (Springer Netherlands, 1998).
Conference Paper
Vesna, V. & Gimzewski, J. K. Blue morph: metaphor and metamorphosis. Proceedings of the international conference on Multimedia 1403–1404 (ACM, 2010).
Gimzewski, J. K. & Veprek, S. DETERMINATION OF THE ENERGIES OF IMPURITY IONS IN A LOW-PRESSURE PLASMA USING PLASMA CHEMICAL ETCHING. HELVETICA PHYSICA ACTA 56, 959–960 (BIRKHAUSER VERLAG AG PO BOX 133 KLOSTERBERG 23, CH-4010 BASEL, SWITZERLAND, 1983).
Veprek, S. et al. PROPERTIES OF MICROCRYSTALLINE SILICON-ELECTRICAL-CONDUCTIVITY, ELECTRON-SPIN RESONANCE AND THE EFFECT OF GAS-ADSORPTION. HELVETICA PHYSICA ACTA 55, 161–161 (BIRKHAUSER VERLAG AG PO BOX 133 KLOSTERBERG 23, CH-4010 BASEL, SWITZERLAND, 1982).
Pohl, D. W., Gimzewski, J. K., Humbert, A. & Vepek, S. Surface Topography Studies Of Nanocrystalline Si by STM. 29th Annual Technical Symposium 98–101 (International Society for Optics and Photonics, 1986).
Journal Article
Victoria, V. & James, G. BLUE MORPH: REFLECTIONS ON PERFORMANCE OF SELF ORGANIZED CRITICALITY (Blue Morph: uwagi o dzialaniu samoorganizujacej sie zmiany krytycznej (self-organized criticality)). Przegląd Kulturoznawczy 154–160 (2011).
Vesna, V. & Gimzewski, J. Blue Morph: Reflections on Performance of Self Organized Criticality 2011. Art Inquiry 285–292 (2011).
Vesna, V. & Gimzewski, J. Blue Morph: uwagi o działaniu samoorganizującej się zmiany krytycznej (self-organized criticality=. Przegląd Kulturoznawczy 154–160 (2011).
Vesna, V. & Gimzewski, J. BlueMorph. Centro Andaluz de Arte Contemporaneo, Seville (2007).
Groner, P., Gimzewski, J. K. & Veprek, S. BORON AND DOPED BORON 1ST WALL COATINGS BY PLASMA CVD. JOURNAL OF NUCLEAR MATERIALS 103, 257–260 (1982).
Groner, P., Gimzewski, J. K. & Veprek, S. Boron and doped boron first wall coatings by plasma CVD. Journal of Nuclear Materials 103, 257–260 (1981).
Baller, M. K. et al. A cantilever array-based artificial nose. Ultramicroscopy 82, 1–9 (2000).
Pelling, A. E., Sehati, S., Gralla, E. B., Valentine, J. S. & Gimzewski, J. K. Cell Biology: Local Nanomechanical Motion of the Cell Wall of Saccharomyces cerevisiae. SCIENCE-NEW YORK THEN WASHINGTON- 1147–1149 (2004).
Baller, M. K. et al. Charras, GT, see Lehenkari, PP 82 (2000) 289. Ultramicroscopy 82, 310 (2000).
Lang, H. P. et al. A chemical sensor based on a micromechanical cantilever array for the identification of gases and vapors. Applied Physics A: Materials Science & Processing 66, S61–S64 (1998).
Gimzewski, J. K., Brewer, R. J., VepYek, S. & Stuessi, H. THE EFFECT OF A HYDROGEN PLASMA ON THE HYDRIDING OF TITANIUM: KINETICS AND EQUILIBRIUM CONCENTRATION. (Submitted).
Brewer, R. J., Gimzewski, J. K., Veprek, S. & Stuessi, H. Effect of surface contamination and pretreatment on the hydrogen diffusion into and out of titanium under plasma conditions. Journal of Nuclear Materials 103, 465–469 (1981).
Fornaro, P. et al. AN ELECTRONIC NOSE BASED ON A MICROMECHANICAL CANTILEVER ARRAY. Micro Total Analysis Systems' 98: Proceedings of the Utas' 98 Workshop, Held in Banff, Canada, 13-16 October 1998 57 (1998).
Steiner, W. et al. The following patents were recently issued by the countries in which the inventions were made. For US patents, titles and names supplied to us by the US Patent Office are reproduced exactly as they appear on the original published patent. (Submitted).
Yamashita, K., Gimzewski, J. K. & Veprek, S. Hydrogen trapping in zirconium under plasma conditions. Journal of Nuclear Materials 128, 705–707 (1984).
Gimzewski, J. K. et al. Impurity deposition profiles in the plasma edge of the TCA Tokamak. Physica Scripta 30, 271 (1984).
Gimzewski, J. K. et al. Impurity recycling and retention on Au and C surfaces exposed to the scrape-off layer of the TCA tokamak. Journal of Vacuum Science & Technology A 4, 90–96 (1986).
Berger, R. et al. Integration of silicon micromechanical arrays with molecular monolayers for miniaturized sensor systems. Sensors and Their Applications VIII, Proceedings of the eighth conference on Sensors and their Applications, held in Glasgow, UK, 7-10 September 1997 7, 71 (1997).
Gimzewski, J. K. & Veprek, S. Investigation of impurity retention, implantation and sputtering phenomena on au and c surfaces exposed to the scrape-off-layer. Journal of Nuclear Materials 128, 703–704 (1984).
Gimzewski, J. K. & Veprek, S. Investigation of the initial stages of oxidation of microcrystalline silicon by means of X-ray photoelectron spectroscopy. Solid state communications 47, 747–751 (1983).
Pelling, A. E., Sehati, S., Gralla, E. B., Valentine, J. S. & Gimzewski, J. K. Local nanomechanical motion of the cell wall of Saccharomyces cerevisiae. Science 305, 1147–1150 (2004).
Vesna, V. & Gimzewski, J. K. NANO: An Exhibition of Scale and Senses. Leonardo 38, 310–311 (2005).
Wilkinson, P. R., Klug, W. S., Van Leer, B. & Gimzewski, J. K. Nanomechanical properties of piezoresistive cantilevers: Theory and experiment. Journal of Applied Physics 104, 103527 (2008).
GIMZEWSKI, J. & Vesna, V. The Nanomeme Syndrome: concerning mechanistic visions of control at a molecular scale. Horizon Zero (2004).
Gimzewski, J. K. & Veprek, S. A novel method for the determination of the energies of impurity ions bombarding a solid surface exposed to a low pressure plasma. Journal of Vacuum Science & Technology A 2, 35–39 (1984).
Lüthi, R. et al. Parallel nanodevice fabrication using a combination of shadow mask and scanning probe methods. Applied physics letters 75, 1314–1316 (1999).
Gimzewski, J. K., VATEL, O. & Hallimaoui, A. Ph. DUMAS*, M. GU*, C. SYRYKH*, F. SALVAN*,* GPEC, URA CNRS 783, Fac. de Luminy, 13288, Marseille Cedex 9, France. Optical Properties of Low Dimensional Silicon Structures: Proceedings of the NATO Advanced Research Workshop, Meylan, France, March 1-3, 1993 244, 157 (1993).
Veprek, S. et al. Properties of microcrystalline silicon. IV. Electrical conductivity, electron spin resonance and the effect of gas adsorption. Journal of Physics C: Solid State Physics 16, 6241 (1983).
Gimzewski, J. K., Humbert, A., Pohl, D. W. & Vepfek, S. A SCANNING TUNNELING MICROSCOPIC (STM) STUDY OF THE SURFACE TOPOGRAPHY OF PLASMA-DEPOSITED NANOCRYSTALLINE SILICON. (1985).
Gimzewski, J. K., Humbert, A., Pohl, D. W. & Veprek, S. Scanning tunneling microscopy of nanocrystalline silicon surfaces. Surface Science 168, 795–800 (1986).
Hofmann, F. et al. Scrape-off measurements during Alfvén wave heating in the TCA tokamak. Journal of Nuclear Materials 121, 22–28 (1984).
Lang, H. P. et al. Sequential position readout from arrays of micromechanical cantilever sensors. Applied Physics Letters 72, 383–385 (1998).
Murrell, M. P. et al. Spatially resolved electrical measurements of SiO2 gate oxides using atomic force microscopy. Applied physics letters 62, 786–788 (1993).
Demming, A., Gimzewski, J. K. & Vuillaume, D. Synaptic electronics. Nanotechnology 24, 380201 (2013).
Fritz, J. et al. Translating biomolecular recognition into nanomechanics. Science 288, 316–318 (2000).