Publications
Found 16 results
Author Title Type [ Year] Filters: First Letter Of Last Name is O [Clear All Filters]
Abstract B15: Cell motility and deformability in the pathogenesis of lung cancer. Clinical Cancer Research 20, B15–B15 (2014).
Measuring the Strength of Single Crystal and Polycrystalline Graphene. Bulletin of the American Physical Society (2014).
Measurement of the intrinsic strength of crystalline and polycrystalline graphene. Nature communications 4, (2013).
Biomimetics: Controlling the Synaptic Plasticity of a Cu2S Gap-Type Atomic Switch (Adv. Funct. Mater. 17/2012). Advanced Functional Materials 22, 3605–3605 (2012).
Controlling the Synaptic Plasticity of a Cu2S Gap-Type Atomic Switch. Advanced Functional Materials 22, 3606–3613 (2012).
Chemical wiring and soldering toward all-molecule electronic circuitry. Journal of the American Chemical Society 133, 8227–8233 (2011).
Memristive operations demonstrated by gap-type atomic switches. Applied Physics A 102, 811–815 (2011).
Sensory and short-term memory formations observed in a Ag2S gap-type atomic switch. Applied Physics Letters 99, 203108 (2011).
Short-term plasticity and long-term potentiation mimicked in single inorganic synapses. Nature materials 10, 591–595 (2011).
Learning Abilities Achieved by a Single Solid-State Atomic Switch. Advanced Materials 22, 1831–1834 (2010).
6D-1 The Capacitive Micromachined Ultrasonic Transducer (CMUT) as a Chem/Bio Sensor. Ultrasonics Symposium, 2007. IEEE 472–475 (IEEE, 2007).
Capacitive micromachined ultrasonic transducers for chemical detection in nitrogen. Applied Physics Letters 91, 094102 (2007).
Applications of imaging interferometry. SPIE Optics+ Photonics 629301–629301 (International Society for Optics and Photonics, 2006).
Erratum: A femtojoule calorimeter using micromechanical sensors [Rev. Sci. Instrum. 65, 3793 (1994)]. Review of Scientific Instruments 66, 3083–3083 (1995).
A femtojoule calorimeter using micromechanical sensors. Review of Scientific Instruments 65, 3793–3798 (1994).
Spatially resolved electrical measurements of SiO2 gate oxides using atomic force microscopy. Applied physics letters 62, 786–788 (1993).