Found 44 results
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Demming, A., Gimzewski, J. K. & Vuillaume, D. Synaptic electronics. Nanotechnology 24, 380201 (2013).
Vesna, V. & Gimzewski, J. K. Blue morph: metaphor and metamorphosis. Proceedings of the international conference on Multimedia 1403–1404 (ACM, 2010).
Vesna, V. & Gimzewski, J. BlueMorph. Centro Andaluz de Arte Contemporaneo, Seville (2007).
Baller, M. K. et al. A cantilever array-based artificial nose. Ultramicroscopy 82, 1–9 (2000).
Baller, M. K. et al. Charras, GT, see Lehenkari, PP 82 (2000) 289. Ultramicroscopy 82, 310 (2000).
Fritz, J. et al. Translating biomolecular recognition into nanomechanics. Science 288, 316–318 (2000).
Lang, H. P. et al. A chemical sensor based on a micromechanical cantilever array for the identification of gases and vapors. Applied Physics A: Materials Science & Processing 66, S61–S64 (1998).
Fornaro, P. et al. AN ELECTRONIC NOSE BASED ON A MICROMECHANICAL CANTILEVER ARRAY. Micro Total Analysis Systems' 98: Proceedings of the Utas' 98 Workshop, Held in Banff, Canada, 13-16 October 1998 57 (1998).
Lang, H. P. et al. Sequential position readout from arrays of micromechanical cantilever sensors. Applied Physics Letters 72, 383–385 (1998).
Berger, R. et al. Sensor Technology in the Netherlands: State of the Art 33–42 (Springer Netherlands, 1998).
Berger, R. et al. Integration of silicon micromechanical arrays with molecular monolayers for miniaturized sensor systems. Sensors and Their Applications VIII, Proceedings of the eighth conference on Sensors and their Applications, held in Glasgow, UK, 7-10 September 1997 7, 71 (1997).
Gimzewski, J. K., VATEL, O. & Hallimaoui, A. Ph. DUMAS*, M. GU*, C. SYRYKH*, F. SALVAN*,* GPEC, URA CNRS 783, Fac. de Luminy, 13288, Marseille Cedex 9, France. Optical Properties of Low Dimensional Silicon Structures: Proceedings of the NATO Advanced Research Workshop, Meylan, France, March 1-3, 1993 244, 157 (1993).
Dumas, P. et al. Optical Properties of Low Dimensional Silicon Structures 157–162 (Springer Netherlands, 1993).
Murrell, M. P. et al. Spatially resolved electrical measurements of SiO2 gate oxides using atomic force microscopy. Applied physics letters 62, 786–788 (1993).
Gimzewski, J. K. et al. Impurity recycling and retention on Au and C surfaces exposed to the scrape-off layer of the TCA tokamak. Journal of Vacuum Science & Technology A 4, 90–96 (1986).
Gimzewski, J. K., Humbert, A., Pohl, D. W. & Veprek, S. Scanning tunneling microscopy of nanocrystalline silicon surfaces. Surface Science 168, 795–800 (1986).
Pohl, D. W., Gimzewski, J. K., Humbert, A. & Vepek, S. Surface Topography Studies Of Nanocrystalline Si by STM. 29th Annual Technical Symposium 98–101 (International Society for Optics and Photonics, 1986).