Found 4 resultsAuthor Title Type [ Year]
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E. MEYER, M. GUGGISBERG, CH. LOPPACHER. Impact of Electron and Scanning Probe Microscopy on Materials Research 339 (1999).
Impact of Electron and Scanning Probe Microscopy on Materials Research 339–357 (Springer Netherlands, 1999).
A chemical sensor based on a micromechanical cantilever array for the identification of gases and vapors. Applied Physics A: Materials Science & Processing 66, S61–S64 (1998).
Sensor Technology in the Netherlands: State of the Art 33–42 (Springer Netherlands, 1998).