Publications
E. MEYER, M. GUGGISBERG, CH. LOPPACHER. Impact of Electron and Scanning Probe Microscopy on Materials Research 339 (1999).
Impact of Electron and Scanning Probe Microscopy on Materials Research 339–357 (Springer Netherlands, 1999).
Scanning Tunneling Microscopy and Related Methods 269–280 (Springer Netherlands, 1990).