Publications

Found 6 results
Author Title Type [ Year(Desc)]
Filters: Author is Humbert, A and First Letter Of Title is S  [Clear All Filters]
1985
Gimzewski, J. K., Humbert, A., Pohl, D. W. & Vepfek, S. A SCANNING TUNNELING MICROSCOPIC (STM) STUDY OF THE SURFACE TOPOGRAPHY OF PLASMA-DEPOSITED NANOCRYSTALLINE SILICON. (1985).
Gimzewski, J. K., Humbert, A., Bednorz, J. G. & Reihl, B. Silver films condensed at 300 and 90 K: scanning tunneling microscopy of their surface topography. Physical review letters 55, 951 (1985).
1986
Gimzewski, J. K., Humbert, A., Pohl, D. W. & Veprek, S. Scanning tunneling microscopy of nanocrystalline silicon surfaces. Surface Science 168, 795–800 (1986).
Gimzewski, J. K. & Humbert, A. Scanning tunneling microscopy of surface microstructure on rough surfaces. IBM journal of research and development 30, 472–477 (1986).
Pohl, D. W., Gimzewski, J. K., Humbert, A. & Vepek, S. Surface Topography Studies Of Nanocrystalline Si by STM. 29th Annual Technical Symposium 98–101 (International Society for Optics and Photonics, 1986).
1995
Gimzewski, J. K. & Humbert, A. Scanning tunneling microscopy of surface microstructure on rough surfaces. SPIE MILESTONE SERIES MS 107, 249–249 (1995).