Publications

Found 5 results
Author Title [ Type(Desc)] Year
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Book Chapter
Lang, H. P. et al. Micro Total Analysis Systems’ 9 57–60 (Springer Netherlands, 1998).
Journal Article
Battiston, F. et al. E. MEYER, M. GUGGISBERG, CH. LOPPACHER. Impact of Electron and Scanning Probe Microscopy on Materials Research 339 (1999).
Fornaro, P. et al. AN ELECTRONIC NOSE BASED ON A MICROMECHANICAL CANTILEVER ARRAY. Micro Total Analysis Systems' 98: Proceedings of the Utas' 98 Workshop, Held in Banff, Canada, 13-16 October 1998 57 (1998).