Publications

Found 13 results
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Journal Article
Tang, H., Cuberes, M. T., Joachim, C. & Gimzewski, J. K. Fundamental considerations in the manipulation of a single C< sub> 60 molecule on a surface with an STM. Surface science 386, 115–123 (1997).
Stoll, E. P. & Gimzewski, J. K. Fundamental and practical aspects of differential scanning tunneling microscopy. Journal of Vacuum Science & Technology B 9, 643–647 (1991).
Zhu, L. et al. Functional characterization of cell-wall-associated protein WapA in Streptococcus mutans. Microbiology 152, 2395–2404 (2006).
R Wali, P. et al. Fourier transform mechanical spectroscopy of micro-fabricated electromechanical resonators: A novel, information-rich pulse method for sensor applications. Sensors and Actuators B: Chemical 147, 508–516 (2010).
Loppacher, C. et al. Forces with submolecular resolution between the probing tip and Cu-TBPP molecules on Cu (100) observed with a combined AFM/STM. Applied Physics A 72, S105–S108 (2001).
Dürig, U., Gimzewski, J. K., Pohl, D. W. & Schlittler, R. Force Sensing in Scanning Tunneling Microscopy. IBM, Rüschlikon 1 (1986).
Steiner, W. et al. The following patents were recently issued by the countries in which the inventions were made. For US patents, titles and names supplied to us by the US Patent Office are reproduced exactly as they appear on the original published patent. (Submitted).
Zhang, W. et al. Folding of a donor–acceptor polyrotaxane by using noncovalent bonding interactions. Proceedings of the National Academy of Sciences 105, 6514–6519 (2008).
Stieg, A. Z., Rasool, H. I. & Gimzewski, J. K. A flexible, highly stable electrochemical scanning probe microscope for nanoscale studies at the solid-liquid interface. Review of Scientific Instruments 79, 103701 (2008).
Coombs, J. H. & Gimzewski, J. K. Fine structure in field emission resonances at surfaces. Journal of Microscopy 152, 841–851 (1988).
Reihl, B. & Gimzewski, J. K. Field emission scanning Auger microscope (FESAM). Surface Science 189, 36–43 (1987).
, et al. A femtojoule calorimeter using micromechanical sensors. Review of Scientific Instruments 65, 3793–3798 (1994).