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Reed, J. et al. Identifying individual DNA species in a complex mixture by precisely measuring the spacing between nicking restriction enzymes with atomic force microscope. Journal of The Royal Society Interface 9, 2341–2350 (2012).
Gimzewski, J. K. et al. Impurity deposition profiles in the plasma edge of the TCA Tokamak. Physica Scripta 30, 271 (1984).
Gimzewski, J. K. et al. Impurity recycling and retention on Au and C surfaces exposed to the scrape-off layer of the TCA tokamak. Journal of Vacuum Science & Technology A 4, 90–96 (1986).
Sharma, S. et al. Influence of substrates on hepatocytes: a nanomechanical study. Journal of Scanning Probe Microscopy 4, 7–16 (2009).
Berndt, R. & Gimzewski, J. K. Injection luminescence from CdS (112{\={}} 0) studied with scanning tunneling microscopy. Physical Review B 45, 14095 (1992).
Berger, R. et al. Integration of silicon micromechanical arrays with molecular monolayers for miniaturized sensor systems. Sensors and Their Applications VIII, Proceedings of the eighth conference on Sensors and their Applications, held in Glasgow, UK, 7-10 September 1997 7, 71 (1997).
Gimzewski, J. K., Donnelly, T. & Affrossman, S. Interaction of ozone with nickel ions adsorbed on alumina. Journal of Catalysis 47, 79–84 (1977).
Reed, J., Schmit, J., Han, S., Wilkinson, P. & Gimzewski, J. K. Interferometric profiling of microcantilevers in liquid. Optics and Lasers in Engineering 47, 217–222 (2009).
Gaisch, R. et al. Internal structure of C60 fullerence molecules as revealed by low-temperature STM. Applied Physics A 57, 207–210 (1993).
Gaisch, R. et al. Internal structure of C60 on Au (110) as observed by low-temperature scanning tunneling microscopy. Journal of Vacuum Science & Technology B 12, 2153–2155 (1994).
Gimzewski, J. K. & Veprek, S. Investigation of impurity retention, implantation and sputtering phenomena on au and c surfaces exposed to the scrape-off-layer. Journal of Nuclear Materials 128, 703–704 (1984).
Gimzewski, J. K. & Veprek, S. Investigation of the initial stages of oxidation of microcrystalline silicon by means of X-ray photoelectron spectroscopy. Solid state communications 47, 747–751 (1983).
Gimzewski, J. K. et al. Investigations of the surface of the amorphous alloy Fe< sub> 80 B< sub> 20 by STM, XPS and AES. Journal of non-crystalline solids 116, 253–261 (1990).