Publications

Found 21 results
Author Title [ Type(Desc)] Year
Filters: First Letter Of Title is P and Author is Gimzewski, JK  [Clear All Filters]
Book Chapter
Gimzewski, J. K. Photons and Local Probes 189–208 (Springer Netherlands, 1995).
Conference Paper
Berndt, R. & Gimzewski, J. K. Photon Emission from C60 in a Nanoscopic Cavity. Proceedings of the NATO Advanced Research Workshop: (Humboldt-Universität zu Berlin, 1994).
Journal Article
Schmit, J., Reed, J., Novak, E. & Gimzewski, J. K. Performance advances in interferometric optical profilers for imaging and testing. Journal of Optics A: Pure and Applied Optics 10, 064001 (2008).
Gimzewski, J. K., VATEL, O. & Hallimaoui, A. Ph. DUMAS*, M. GU*, C. SYRYKH*, F. SALVAN*,* GPEC, URA CNRS 783, Fac. de Luminy, 13288, Marseille Cedex 9, France. Optical Properties of Low Dimensional Silicon Structures: Proceedings of the NATO Advanced Research Workshop, Meylan, France, March 1-3, 1993 244, 157 (1993).
Berndt, R. R. J. K. B. R. R. W. D. M. et al. Photon emission at molecular resolution induced by a scanning tunneling microscope. Science 262, 1425–1427 (1993).
Coombs, J. H., Gimzewski, J. K., Reihl, B., Sass, J. K. & Schlittler, R. R. Photon emission experiments with the scanning tunnelling microscope. Journal of Microscopy 152, 325–336 (1988).
Berndt, R. et al. Photon emission from adsorbed C60 molecules with sub-nanometer lateral resolution. Applied Physics A 57, 513–516 (1993).
Berndt, R., Gimzewski, J. K. & Schlittler, R. R. Photon emission from nanostructures in an STM. Nanostructured Materials 3, 345–348 (1993).
Berndt, R., Gimzewski, J. K. & Schlittler, R. R. Photon emission from small particles in an STM. Zeitschrift für Physik D Atoms, Molecules and Clusters 26, 87–88 (1993).
Berndt, R., Schlittler, R. R. & Gimzewski, J. K. Photon emission processes in STM. AIP Conf Proceedings 241, 328–336 (1992).
Berndt, R., Schlittler, R. R. & Gimzewski, J. K. Photon emission scanning tunneling microscope. Journal of Vacuum Science & Technology B 9, 573–577 (1991).
Gimzewski, J. K., Reihl, B., Coombs, J. H. & Schlittler, R. R. Photon emission with the scanning tunneling microscope. Zeitschrift für Physik B Condensed Matter 72, 497–501 (1988).
Dumas, P. et al. Photon spectroscopy, mapping, and topography of 85% porous silicon. Journal of Vacuum Science & Technology B 12, 2064–2066 (1994).
Dumaks, P. et al. Photon Spectroscopy, Mapping, and Topography of 85-Percent Porous Silicon. Journal of Vacuum Science & Technology B 12, 2064–2066 (1994).
McKinnon, A. W., Welland, M. E., Wong, T. M. H. & Gimzewski, J. K. Photon-emission scanning tunneling microscopy of silver films in ultrahigh vacuum: A spectroscopic method. Physical Review B 48, 15250 (1993).
Joachim, C., Gimzewski, J. K. & Tang, H. Physical principles of the single-C 60 transistor effect. Physical Review B 58, 16407 (1998).
Humbert, A., Gimzewski, J. K. & Reihl, B. Postannealing of coldly condensed Ag films: Influence of pyridine preadsorption. Physical Review B 32, 4252 (1985).
Welland, M. E., Miles, M. J. & Gimzewski, J. K. Probe Microscopy: Editorial. Probe Microscopy 1, 1–1 (1997).
Veprek, S. et al. Properties of microcrystalline silicon. IV. Electrical conductivity, electron spin resonance and the effect of gas adsorption. Journal of Physics C: Solid State Physics 16, 6241 (1983).
Sass, J. K. & Gimzewski, J. K. Proposal for the simulation of electrochemical charge transfer in the scanning tunneling microscope. Journal of electroanalytical chemistry and interfacial electrochemistry 251, 241–245 (1988).
Miscellaneous
Gimzewski, J. K. et al. Plasma surface interactions in the TCA tokamak: a preliminary study using deposition probes. (1982).