Publications

Found 32 results
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B
Berndt, R. & Gimzewski, J. K. Photon Emission from C60 in a Nanoscopic Cavity. Proceedings of the NATO Advanced Research Workshop: (Humboldt-Universität zu Berlin, 1994).
Berndt, R. & Gimzewski, J. K. Photon emission in scanning tunneling microscopy: Interpretation of photon maps of metallic systems. Physical Review B 48, 4746 (1993).
Berndt, R., Gimzewski, J. K. & Schlittler, R. R. Photon emission from small particles in an STM. Zeitschrift für Physik D Atoms, Molecules and Clusters 26, 87–88 (1993).
Berndt, R. et al. Photon emission from adsorbed C60 molecules with sub-nanometer lateral resolution. Applied Physics A 57, 513–516 (1993).
Berndt, R. & Gimzewski, J. K. Photon emission from transition metal surfaces in scanning tunneling microscopy. International Journal of Modern Physics B 7, 516–519 (1993).
Berndt, R., Schlittler, R. R. & Gimzewski, J. K. Photon emission scanning tunneling microscope. Journal of Vacuum Science & Technology B 9, 573–577 (1991).
Berndt, R., Schlittler, R. R. & Gimzewski, J. K. Photon emission processes in STM. AIP Conf Proceedings 241, 328–336 (1992).
Berndt, R. & Gimzewski, J. K. Photon emission in scanning tunneling microscopy: interpretation of photon maps of metallic systems. SPIE MILESTONE SERIES MS 107, 376–376 (1995).
Berndt, R. R. J. K. B. R. R. W. D. M. et al. Photon emission at molecular resolution induced by a scanning tunneling microscope. Science 262, 1425–1427 (1993).
Berndt, R., Gimzewski, J. K. & Schlittler, R. R. Photon emission from nanostructures in an STM. Nanostructured Materials 3, 345–348 (1993).
D
Dumaks, P. et al. Photon Spectroscopy, Mapping, and Topography of 85-Percent Porous Silicon. Journal of Vacuum Science & Technology B 12, 2064–2066 (1994).
Dumas, P. et al. Photon spectroscopy, mapping, and topography of 85% porous silicon. Journal of Vacuum Science & Technology B 12, 2064–2066 (1994).
S
Sass, J. K. & Gimzewski, J. K. Proposal for the simulation of electrochemical charge transfer in the scanning tunneling microscope. Journal of electroanalytical chemistry and interfacial electrochemistry 251, 241–245 (1988).
Schmit, J., Reed, J., Novak, E. & Gimzewski, J. K. Performance advances in interferometric optical profilers for imaging and testing. Journal of Optics A: Pure and Applied Optics 10, 064001 (2008).
V
Veprek, S. et al. Properties of microcrystalline silicon. IV. Electrical conductivity, electron spin resonance and the effect of gas adsorption. Journal of Physics C: Solid State Physics 16, 6241 (1983).
Veprek, S. et al. PROPERTIES OF MICROCRYSTALLINE SILICON-ELECTRICAL-CONDUCTIVITY, ELECTRON-SPIN RESONANCE AND THE EFFECT OF GAS-ADSORPTION. HELVETICA PHYSICA ACTA 55, 161–161 (BIRKHAUSER VERLAG AG PO BOX 133 KLOSTERBERG 23, CH-4010 BASEL, SWITZERLAND, 1982).