Berndt, R., Schlittler, R. R. & Gimzewski, J. K. Photon emission processes in STM. AIP Conf Proceedings 241, 328–336 (1992).

Berndt, R. & Gimzewski, J. K. Photon emission in scanning tunneling microscopy: interpretation of photon maps of metallic systems. SPIE MILESTONE SERIES MS 107, 376–376 (1995).

Berndt, R. R. J. K. B. R. R. W. D. M. et al. Photon emission at molecular resolution induced by a scanning tunneling microscope. Science 262, 1425–1427 (1993).

Berndt, R., Gimzewski, J. K. & Schlittler, R. R. Photon emission from nanostructures in an STM. Nanostructured Materials 3, 345–348 (1993).

Berndt, R. & Gimzewski, J. K. Photon Emission from C60 in a Nanoscopic Cavity. Proceedings of the NATO Advanced Research Workshop: (Humboldt-Universität zu Berlin, 1994).

Berndt, R. & Gimzewski, J. K. Photon emission in scanning tunneling microscopy: Interpretation of photon maps of metallic systems. Physical Review B 48, 4746 (1993).

Berndt, R., Gimzewski, J. K. & Schlittler, R. R. Photon emission from small particles in an STM. Zeitschrift für Physik D Atoms, Molecules and Clusters 26, 87–88 (1993).

Berndt, R. et al. Photon emission from adsorbed C60 molecules with sub-nanometer lateral resolution. Applied Physics A 57, 513–516 (1993).

Berndt, R. & Gimzewski, J. K. Photon emission from transition metal surfaces in scanning tunneling microscopy. International Journal of Modern Physics B 7, 516–519 (1993).

Berndt, R., Schlittler, R. R. & Gimzewski, J. K. Photon emission scanning tunneling microscope. Journal of Vacuum Science & Technology B 9, 573–577 (1991).

Coombs, J. H., Gimzewski, J. K., Reihl, B., Sass, J. K. & Schlittler, R. R. Photon emission experiments with the scanning tunnelling microscope. Journal of Microscopy 152, 325–336 (1988).

Dumaks, P. et al. Photon Spectroscopy, Mapping, and Topography of 85-Percent Porous Silicon. Journal of Vacuum Science & Technology B 12, 2064–2066 (1994).

Dumas, P. et al. Photon spectroscopy, mapping, and topography of 85% porous silicon. Journal of Vacuum Science & Technology B 12, 2064–2066 (1994).

Galaxy, I. Photothermal spectroscopy with femtojoule sensitivity using a micromechanical device. Nature 372, 3 (1994).

Gimzewski, J. A. M. E. S. K. A. Z. I. M. I. E. R. Z. Photomechanical transducer. (1999).

Gimzewski, J. K. Photons and Local Probes 189–208 (Springer Netherlands, 1995).

Gimzewski, J. K., Reihl, B., Coombs, J. H. & Schlittler, R. R. Photon emission with the scanning tunneling microscope. Zeitschrift für Physik B Condensed Matter 72, 497–501 (1988).

Gimzewski, J. K. et al. Plasma surface interactions in the TCA tokamak: a preliminary study using deposition probes. (1982).

Gimzewski, J. K., VATEL, O. & Hallimaoui, A. Ph. DUMAS*, M. GU*, C. SYRYKH*, F. SALVAN*,* GPEC, URA CNRS 783, Fac. de Luminy, 13288, Marseille Cedex 9, France. Optical Properties of Low Dimensional Silicon Structures: Proceedings of the NATO Advanced Research Workshop, Meylan, France, March 1-3, 1993 244, 157 (1993).

Guo, L. et al. Phenotypic characterization of the foldase homologue PrsA in Streptococcus mutans. Molecular oral microbiology 28, 154–165 (2013).

Humbert, A., Gimzewski, J. K. & Reihl, B. Postannealing of coldly condensed Ag films: Influence of pyridine preadsorption. Physical Review B 32, 4252 (1985).

Joachim, C., Gimzewski, J. K. & Tang, H. Physical principles of the single-C 60 transistor effect. Physical Review B 58, 16407 (1998).

Lüthi, R. et al. Parallel nanodevice fabrication using a combination of shadow mask and scanning probe methods. Applied physics letters 75, 1314–1316 (1999).

McKinnon, A. W., Welland, M. E., Wong, T. M. H. & Gimzewski, J. K. Photon-emission scanning tunneling microscopy of silver films in ultrahigh vacuum: A spectroscopic method. Physical Review B 48, 15250 (1993).

Sass, J. K. & Gimzewski, J. K. Proposal for the simulation of electrochemical charge transfer in the scanning tunneling microscope. Journal of electroanalytical chemistry and interfacial electrochemistry 251, 241–245 (1988).

Schmit, J., Reed, J., Novak, E. & Gimzewski, J. K. Performance advances in interferometric optical profilers for imaging and testing. Journal of Optics A: Pure and Applied Optics 10, 064001 (2008).

Tanoue, R. et al. Positional selectivity of reversible azomethine condensation reactions at solid/liquid interfaces leading to supramolecule formation. Journal of Electroanalytical Chemistry 716, 145–149 (2014).

Veprek, S. et al. PROPERTIES OF MICROCRYSTALLINE SILICON-ELECTRICAL-CONDUCTIVITY, ELECTRON-SPIN RESONANCE AND THE EFFECT OF GAS-ADSORPTION. HELVETICA PHYSICA ACTA 55, 161–161 (BIRKHAUSER VERLAG AG PO BOX 133 KLOSTERBERG 23, CH-4010 BASEL, SWITZERLAND, 1982).

Veprek, S. et al. Properties of microcrystalline silicon. IV. Electrical conductivity, electron spin resonance and the effect of gas adsorption. Journal of Physics C: Solid State Physics 16, 6241 (1983).

Welland, M. E., Miles, M. J. & Gimzewski, J. K. Probe Microscopy: Editorial. Probe Microscopy 1, 1–1 (1997).

Welland, M. E. & Gimzewski, J. K. Perspectives on the limits of fabrication and measurement. PHILOS T ROY SOC A 353, 279–279 (1995).

Yokoi, N. et al. Protein engineering: Construction of Robust Bio-nanotubes using the Controlled Self-Assembly of Component Proteins of Bacteriophage T4 (Small 17/2010). Small 6, (2010).