Found 27 results
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Langlais, V. J. et al. Spatially resolved tunneling along a molecular wire. Physical review letters 83, 2809 (1999).
Lang, H. P. et al. Sequential position readout from arrays of micromechanical cantilever sensors. Applied Physics Letters 72, 383–385 (1998).
Schaffner, M. - H. et al. Size-dependent light emission from mass-selected clusters. The European Physical Journal D-Atomic, Molecular, Optical and Plasma Physics 2, 79–82 (1998).
Cuberes, M. T., Schlittler, R. R. & Gimzewski, J. K. Supramolecular assembly of individual C 60 molecules on a monolayer of 4, 4′-dimethylbianthrone molecules. Applied Physics A: Materials Science & Processing 66, S745–S748 (1998).
Berger, R. et al. Surface stress in the self-assembly of alkanethiols on gold probed. by a force microscopy technique. Applied Physics A: Materials Science & Processing 66, S55–S59 (1998).
Gimzewski, J. K. Scanning tunneling and local probe studies of fullerenes. NATO ASI Series E Applied Sciences-Advanced Study Institute 316, 117–138 (1996).
Dumas, P. et al. Optical Properties of Low Dimensional Silicon Structures 157–162 (Springer Netherlands, 1993).
Gimzewski, J. K. Scanning tunneling microscopy. Le Journal de Physique IV 3, C7–41 (1993).
Sass, J. K. & Gimzewski, J. K. Solvent dynamical effects in scanning tunneling microscopy with a polar liquid in the gap. Journal of electroanalytical chemistry and interfacial electrochemistry 308, 333–337 (1991).
Berndt, R., Baratoff, A. & Gimzewski, J. K. Scanning Tunneling Microscopy and Related Methods 269–280 (Springer Netherlands, 1990).
Gimzewski, J. K., Humbert, A., Pohl, D. W. & Veprek, S. Scanning tunneling microscopy of nanocrystalline silicon surfaces. Surface Science 168, 795–800 (1986).
Gimzewski, J. K. & Humbert, A. Scanning tunneling microscopy of surface microstructure on rough surfaces. IBM journal of research and development 30, 472–477 (1986).
Pohl, D. W., Gimzewski, J. K., Humbert, A. & Vepek, S. Surface Topography Studies Of Nanocrystalline Si by STM. 29th Annual Technical Symposium 98–101 (International Society for Optics and Photonics, 1986).
Hofmann, F. et al. Scrape-off measurements during Alfvén wave heating in the TCA tokamak. Journal of Nuclear Materials 121, 22–28 (1984).