Publications

Found 27 results
Author Title Type [ Year(Asc)]
Filters: First Letter Of Title is S and Author is Gimzewski, JK  [Clear All Filters]
2001
Schlittler, R. R. et al. Single crystals of single-walled carbon nanotubes formed by self-assembly. Science 292, 1136–1139 (2001).
2000
Fritz, J. et al. Stress at the solid-liquid interface of self-assembled monolayers on gold investigated with a nanomechanical sensor. Langmuir 16, 9694–9696 (2000).
1999
Langlais, V. J. et al. Spatially resolved tunneling along a molecular wire. Physical review letters 83, 2809 (1999).
1998
Lang, H. P. et al. Sequential position readout from arrays of micromechanical cantilever sensors. Applied Physics Letters 72, 383–385 (1998).
Schaffner, M. - H. et al. Size-dependent light emission from mass-selected clusters. The European Physical Journal D-Atomic, Molecular, Optical and Plasma Physics 2, 79–82 (1998).
Cuberes, M. T., Schlittler, R. R. & Gimzewski, J. K. Supramolecular assembly of individual C 60 molecules on a monolayer of 4, 4′-dimethylbianthrone molecules. Applied Physics A: Materials Science & Processing 66, S745–S748 (1998).
Berger, R. et al. Surface stress in the self-assembly of alkanethiols on gold probed. by a force microscopy technique. Applied Physics A: Materials Science & Processing 66, S55–S59 (1998).
1997
Cuberes, M. T., Schlittler, R. R., Jung, T. A., Schaumburg, K. & Gimzewski, J. K. A scanning tunneling microscopy investigation of 4, 4′-dimethylbianthrone molecules adsorbed on Cu (111). Surface science 383, 37–49 (1997).
Gimzewski, J. K., Jung, T. A., Cuberes, M. T. & Schlittler, R. R. Scanning tunneling microscopy of individual molecules: beyond imaging. Surface science 386, 101–114 (1997).
1996
Gimzewski, J. K. Scanning tunneling and local probe studies of fullerenes. NATO ASI Series E Applied Sciences-Advanced Study Institute 316, 117–138 (1996).
1995
Gimzewski, J. K. & Humbert, A. Scanning tunneling microscopy of surface microstructure on rough surfaces. SPIE MILESTONE SERIES MS 107, 249–249 (1995).
Modesti, S., Gimzewski, J. K. & Schlittler, R. R. Stable and metastable reconstructions at the C< sub> 60/Au (110) interface. Surface science 331, 1129–1135 (1995).
1994
Gimzewski, J. K., Modesti, S., David, T. & Schlittler, R. R. Scanning tunneling microscopy of ordered C60 and C70 layers on Au (111), Cu (111), Ag (110), and Au (110) surfaces. Journal of Vacuum Science & Technology B 12, 1942–1946 (1994).
Modesti, S., Gimzewski, J. K. & Schlittler, R. R. Stable and metastable reconstructions at the C sub 60/Au (110) interface. Surf. Sci.(The Netherlands) 331, 1129–1135 (1994).
1993
Dumas, P. et al. Optical Properties of Low Dimensional Silicon Structures 157–162 (Springer Netherlands, 1993).
Gimzewski, J. K. Scanning tunneling microscopy. Le Journal de Physique IV 3, C7–41 (1993).
1992
Gimzewski, J. K., Berndt, R. & Schlittler, R. R. Scanning-tunneling-microscope study of antiphase domain boundaries, dislocations, and local mass transport on Au (110) surfaces. Physical Review B 45, 6844 (1992).
1991
Sass, J. K. & Gimzewski, J. K. Solvent dynamical effects in scanning tunneling microscopy with a polar liquid in the gap. Journal of electroanalytical chemistry and interfacial electrochemistry 308, 333–337 (1991).
1990
Berndt, R., Baratoff, A. & Gimzewski, J. K. Scanning Tunneling Microscopy and Related Methods 269–280 (Springer Netherlands, 1990).
1987
Gimzewski, J. K., Stoll, E. & Schlittler, R. R. Scanning tunneling microscopy of individual molecules of copper phthalocyanine adsorbed on polycrystalline silver surfaces. Surface Science 181, 267–277 (1987).
1986
Gimzewski, J. K., Humbert, A., Pohl, D. W. & Veprek, S. Scanning tunneling microscopy of nanocrystalline silicon surfaces. Surface Science 168, 795–800 (1986).
Gimzewski, J. K. & Humbert, A. Scanning tunneling microscopy of surface microstructure on rough surfaces. IBM journal of research and development 30, 472–477 (1986).
Pohl, D. W., Gimzewski, J. K., Humbert, A. & Vepek, S. Surface Topography Studies Of Nanocrystalline Si by STM. 29th Annual Technical Symposium 98–101 (International Society for Optics and Photonics, 1986).
1985
Gimzewski, J. K., Humbert, A., Pohl, D. W. & Vepfek, S. A SCANNING TUNNELING MICROSCOPIC (STM) STUDY OF THE SURFACE TOPOGRAPHY OF PLASMA-DEPOSITED NANOCRYSTALLINE SILICON. (1985).
Gimzewski, J. K., Humbert, A., Bednorz, J. G. & Reihl, B. Silver films condensed at 300 and 90 K: scanning tunneling microscopy of their surface topography. Physical review letters 55, 951 (1985).
1984
Hofmann, F. et al. Scrape-off measurements during Alfvén wave heating in the TCA tokamak. Journal of Nuclear Materials 121, 22–28 (1984).
1983
Gimzewski, J. K. et al. Scrape-off measurements during Alfvén wave heating in the TCA tokamak. (1983).