Publications

Found 3 results
Author Title Type [ Year(Desc)]
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1986
Gimzewski, J. K., Humbert, A., Pohl, D. W. & Veprek, S. Scanning tunneling microscopy of nanocrystalline silicon surfaces. Surface Science 168, 795–800 (1986).
Pohl, D. W., Gimzewski, J. K., Humbert, A. & Vepek, S. Surface Topography Studies Of Nanocrystalline Si by STM. 29th Annual Technical Symposium 98–101 (International Society for Optics and Photonics, 1986).