Publications

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Gimzewski, J. K., Humbert, A., Pohl, D. W. & Veprek, S. Scanning tunneling microscopy of nanocrystalline silicon surfaces. Surface Science 168, 795–800 (1986).
Gimzewski, J. K. et al. Scrape-off measurements during Alfvén wave heating in the TCA tokamak. (1983).
Hofmann, F. et al. Scrape-off measurements during Alfvén wave heating in the TCA tokamak. Journal of Nuclear Materials 121, 22–28 (1984).