Publications

Found 168 results
Author [ Title(Asc)] Type Year
Filters: Author is Gimzewski, JK  [Clear All Filters]
A B C D E F G H I J K L M N O P Q R S T U V W X Y Z 
P
Veprek, S. et al. Properties of microcrystalline silicon. IV. Electrical conductivity, electron spin resonance and the effect of gas adsorption. Journal of Physics C: Solid State Physics 16, 6241 (1983).
Welland, M. E., Miles, M. J. & Gimzewski, J. K. Probe Microscopy: Editorial. Probe Microscopy 1, 1–1 (1997).
Humbert, A., Gimzewski, J. K. & Reihl, B. Postannealing of coldly condensed Ag films: Influence of pyridine preadsorption. Physical Review B 32, 4252 (1985).
Gimzewski, J. K. et al. Plasma surface interactions in the TCA tokamak: a preliminary study using deposition probes. (1982).
Joachim, C., Gimzewski, J. K. & Tang, H. Physical principles of the single-C 60 transistor effect. Physical Review B 58, 16407 (1998).
McKinnon, A. W., Welland, M. E., Wong, T. M. H. & Gimzewski, J. K. Photon-emission scanning tunneling microscopy of silver films in ultrahigh vacuum: A spectroscopic method. Physical Review B 48, 15250 (1993).
Dumaks, P. et al. Photon Spectroscopy, Mapping, and Topography of 85-Percent Porous Silicon. Journal of Vacuum Science & Technology B 12, 2064–2066 (1994).
Dumas, P. et al. Photon spectroscopy, mapping, and topography of 85% porous silicon. Journal of Vacuum Science & Technology B 12, 2064–2066 (1994).
Gimzewski, J. K., Reihl, B., Coombs, J. H. & Schlittler, R. R. Photon emission with the scanning tunneling microscope. Zeitschrift für Physik B Condensed Matter 72, 497–501 (1988).
Berndt, R., Schlittler, R. R. & Gimzewski, J. K. Photon emission scanning tunneling microscope. Journal of Vacuum Science & Technology B 9, 573–577 (1991).
Berndt, R., Schlittler, R. R. & Gimzewski, J. K. Photon emission processes in STM. AIP Conf Proceedings 241, 328–336 (1992).
Gimzewski, J. K. Photons and Local Probes 189–208 (Springer Netherlands, 1995).
Berndt, R., Gimzewski, J. K. & Schlittler, R. R. Photon emission from small particles in an STM. Zeitschrift für Physik D Atoms, Molecules and Clusters 26, 87–88 (1993).
Berndt, R., Gimzewski, J. K. & Schlittler, R. R. Photon emission from nanostructures in an STM. Nanostructured Materials 3, 345–348 (1993).
Berndt, R. & Gimzewski, J. K. Photon Emission from C60 in a Nanoscopic Cavity. Proceedings of the NATO Advanced Research Workshop: (Humboldt-Universität zu Berlin, 1994).
Berndt, R. et al. Photon emission from adsorbed C60 molecules with sub-nanometer lateral resolution. Applied Physics A 57, 513–516 (1993).
Coombs, J. H., Gimzewski, J. K., Reihl, B., Sass, J. K. & Schlittler, R. R. Photon emission experiments with the scanning tunnelling microscope. Journal of Microscopy 152, 325–336 (1988).
Berndt, R. R. J. K. B. R. R. W. D. M. et al. Photon emission at molecular resolution induced by a scanning tunneling microscope. Science 262, 1425–1427 (1993).
Gimzewski, J. K., VATEL, O. & Hallimaoui, A. Ph. DUMAS*, M. GU*, C. SYRYKH*, F. SALVAN*,* GPEC, URA CNRS 783, Fac. de Luminy, 13288, Marseille Cedex 9, France. Optical Properties of Low Dimensional Silicon Structures: Proceedings of the NATO Advanced Research Workshop, Meylan, France, March 1-3, 1993 244, 157 (1993).
Schmit, J., Reed, J., Novak, E. & Gimzewski, J. K. Performance advances in interferometric optical profilers for imaging and testing. Journal of Optics A: Pure and Applied Optics 10, 064001 (2008).
O
Gimzewski, J. K., Affrossman, S., Gibson, M. T., Watson, L. M. & Fabian, D. J. Oxidation of scandium by oxygen and water studied by XPS. Surface Science 80, 298–305 (1979).
Gimzewski, J. K. et al. Near Field Optics 333–340 (Springer Netherlands, 1993).
Jung, T., Schlittler, R., Gimzewski, J. K. & Himpsel, F. J. One-dimensional metal structures at decorated steps. Applied Physics A 61, 467–474 (1995).
Gimzewski, J. K., Berndt, R. & Schlittler, R. R. Observation of the temporal evolution of the (1$\times$ 2) reconstructed Au (110) surface using scanning tunneling microscopy. Journal of Vacuum Science & Technology B 9, 897–901 (1991).
Gimzewski, J. K., Berndt, R. & Schlittler, R. R. Observation of the temporal evolution of the (1 times 2) reconstructed Au (110) surface using scanning tunneling microscopy. Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena;(United States) 9, (Submitted).
Naranjo, B., Gimzewski, J. K. & Putterman, S. E. T. H. Observation of nuclear fusion driven by a pyroelectric crystal. Nature 434, 1115–1117 (2005).
Reed, J., Wilkinson, P., Schmit, J., Klug, W. & Gimzewski, J. K. Observation of nanoscale dynamics in cantilever sensor arrays. Nanotechnology 17, 3873 (2006).
Gimzewski, J. K., Berndt, R. & Schlittler, R. R. Observation of mass transport on Au (110)-(1$\times$ 2) reconstructed surfaces using scanning tunneling microscopy. Surface Science Letters 247, A213 (1990).
Gimzewski, J. K., Berndt, R. & Schlittler, R. R. Observation of mass transport on Au (110)-(1$\times$ 2) reconstructed surfaces using scanning tunneling microscopy. Surface Science 247, 327–332 (1991).
Gimzewski, J. K., Berndt, R. & Schlittler, R. R. Observation of local photoemission using a scanning tunneling microscope. Ultramicroscopy 42, 366–370 (1992).
Gimzewski, J. K., Modesti, S., Gerber, C. & Schlittler, R. R. Observation of a new Au (111) reconstruction at the interface of an adsorbed C< sub> 60 overlayer. Chemical physics letters 213, 401–406 (1993).
Gimzewski, J. K., Gerber, C., Meyer, E. & Schlittler, R. R. Observation of a chemical reaction using a micromechanical sensor. Chemical Physics Letters 217, 589–594 (1994).
N
Gimzewski, J. K. & Veprek, S. A novel method for the determination of the energies of impurity ions bombarding a solid surface exposed to a low pressure plasma. Journal of Vacuum Science & Technology A 2, 35–39 (1984).
Dumas, P. et al. Nanostructuring of porous silicon using scanning tunneling microscopy. Journal of Vacuum Science & Technology B 12, 2067–2069 (1994).
M
Berger, R., Gerber, C., Lang, H. P. & Gimzewski, J. K. Micromechanics: A toolbox for femtoscale science:“Towards a laboratory on a tip”. Microelectronic engineering 35, 373–379 (1997).
Fabian, J. - H. et al. Micro Total Analysis Systems’ 9 117–120 (Springer Netherlands, 1998).
Berger, R. et al. Micromechanical thermogravimetry. Chemical Physics Letters 294, 363–369 (1998).
Scandella, L. et al. Micromechanical Thermal Gravimetry Performed on one Single Zeolite Crystal. Helvetica Physica Acta 71, 3–4 (1998).
Gimzewski, J. K., Gerber, C., Meyer, E. & Schlittler, R. R. Forces in Scanning Probe Methods 123–131 (Springer Netherlands, 1995).
Meyer, E., Gimzewski, J. K., Gerber, C. & Schlittler, R. R. Ultimate Limits of Fabrication and Measurement 89–95 (Springer Netherlands, 1995).
Gimzewski, J. K., Jung, T., Cuberes, M. T., Schlittler, R. R. & Joachim, C. Micro/Nanotribology and Its Applications 299–309 (Springer Netherlands, 1997).
Jr, J. T. Yates et al. Materials index. Surface Science 386, 351–354 (1997).
Cuberes, M. T., Schlittler, R. R. & Gimzewski, J. K. Manipulation of C 60 molecules on Cu (111) surfaces using a scanning tunneling microscope. Applied Physics A: Materials Science & Processing 66, S669–S673 (1998).
L
Gaisch, R. et al. Low-temperature ultra-high-vacuum scanning tunneling microscope. Ultramicroscopy 42, 1621–1626 (1992).
Reihl, B. et al. Low-temperature scanning tunneling microscopy. Physica B: Condensed Matter 197, 64–71 (1994).
Reihl, B., Coombs, J. H. & Gimzewski, J. K. Local inverse photoemission with the scanning tunneling microscope. Surface Science 211, 156–164 (1989).
Gimzewski, J. K., Berndt, R. & Schlittler, R. R. Local Experiments Using Nanofabricated Structures in STM. NATO ASI SERIES E APPLIED SCIENCES 235, 219–219 (1993).
Gimzewski, J. K., Berndt, R. & Schlittler, R. R. Nanosources and Manipulation of Atoms Under High Fields and Temperatures: Applications 219–228 (Springer Netherlands, 1993).
Murray, P. W. et al. l-> 3 DIMENSIONAL STRUCTURES ON A UNI-DIRECTION AL SUBSTRATE. (1995).
I
Gimzewski, J. K. et al. Investigations of the surface of the amorphous alloy Fe< sub> 80 B< sub> 20 by STM, XPS and AES. Journal of non-crystalline solids 116, 253–261 (1990).

Pages