Found 20 resultsAuthor Title [ Type] Year
Filters: Author is Meyer, E [Clear All Filters]
Translating biomolecular recognition into nanomechanics. Science 288, 316–318 (2000).
Thermal analysis using a micromechanical calorimeter. Applied Physics Letters 69, 40–42 (1996).
Surface stress in the self-assembly of alkanethiols on gold probed. by a force microscopy technique. Applied Physics A: Materials Science & Processing 66, S55–S59 (1998).
Stress at the solid-liquid interface of self-assembled monolayers on gold investigated with a nanomechanical sensor. Langmuir 16, 9694–9696 (2000).
Sequential position readout from arrays of micromechanical cantilever sensors. Applied Physics Letters 72, 383–385 (1998).
Observation of a chemical reaction using a micromechanical sensor. Chemical Physics Letters 217, 589–594 (1994).
Micromechanical thermogravimetry. Chemical Physics Letters 294, 363–369 (1998).
Micromechanical Thermal Gravimetry Performed on one Single Zeolite Crystal. Helvetica Physica Acta 71, 3–4 (1998).
Forces with submolecular resolution between the probing tip and Cu-TBPP molecules on Cu (100) observed with a combined AFM/STM. Applied Physics A 72, S105–S108 (2001).
AN ELECTRONIC NOSE BASED ON A MICROMECHANICAL CANTILEVER ARRAY. Micro Total Analysis Systems' 98: Proceedings of the Utas' 98 Workshop, Held in Banff, Canada, 13-16 October 1998 57 (1998).
Direct determination of the energy required to operate a single molecule switch. Physical review letters 90, 066107 (2003).
A chemical sensor based on a micromechanical cantilever array for the identification of gases and vapors. Applied Physics A: Materials Science & Processing 66, S61–S64 (1998).
A chemical sensor based on a microfabricated cantilever array with simultaneous resonance-frequency and bending readout. Sensors and Actuators B: Chemical 77, 122–131 (2001).
An artificial nose based on a micromechanical cantilever array. Analytica Chimica Acta 393, 59–65 (1999).
The nanomechanical NOSE. Micro Electro Mechanical Systems, 1999. MEMS'99. Twelfth IEEE International Conference on 9–13 (IEEE, 1999).
Impact of Electron and Scanning Probe Microscopy on Materials Research 339–357 (Springer Netherlands, 1999).
Micro Total Analysis Systems’ 9 117–120 (Springer Netherlands, 1998).
Forces in Scanning Probe Methods 123–131 (Springer Netherlands, 1995).
Ultimate Limits of Fabrication and Measurement 89–95 (Springer Netherlands, 1995).
Micro Total Analysis Systems’ 9 57–60 (Springer Netherlands, 1998).