Publications

Found 260 results
Author Title Type [ Year(Desc)]
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1993
Dumas, P. et al. Optical Properties of Low Dimensional Silicon Structures 157–162 (Springer Netherlands, 1993).
Dumas, P. et al. Optical Properties of Low Dimensional Silicon Structures 157–162 (Springer Netherlands, 1993).
1994
Berndt, R., Gimzewski, J. K. & Schlittler, R. R. Bias-dependent STM images of oxygen-induced structures on Ti (0001) facets. Surface science 310, 85–88 (1994).
Gimzewski, J. K., Modesti, S. & Schlittler, R. R. Cooperative self-assembly of Au atoms and C 60 on Au (110) surfaces. Physical review letters 72, 1036 (1994).
David, T., Gimzewski, J. K., Purdie, D., Reihl, B. & Schlittler, R. R. Epitaxial growth of C 60 on Ag (110) studied by scanning tunneling microscopy and tunneling spectroscopy. Physical Review B 50, 5810 (1994).
, et al. A femtojoule calorimeter using micromechanical sensors. Review of Scientific Instruments 65, 3793–3798 (1994).
Gaisch, R. et al. Internal structure of C60 on Au (110) as observed by low-temperature scanning tunneling microscopy. Journal of Vacuum Science & Technology B 12, 2153–2155 (1994).
Gaisch, R. et al. Internal structure of C60 on Au (110) as observed by low-temperature scanning tunneling microscopy. Journal of Vacuum Science & Technology B 12, 2153–2155 (1994).
Reihl, B. et al. Low-temperature scanning tunneling microscopy. Physica B: Condensed Matter 197, 64–71 (1994).
Reihl, B. et al. Low-temperature scanning tunneling microscopy. Physica B: Condensed Matter 197, 64–71 (1994).
Dumas, P. et al. Nanostructuring of porous silicon using scanning tunneling microscopy. Journal of Vacuum Science & Technology B 12, 2067–2069 (1994).
Dumas, P. et al. Nanostructuring of porous silicon using scanning tunneling microscopy. Journal of Vacuum Science & Technology B 12, 2067–2069 (1994).
Gimzewski, J. K., Gerber, C., Meyer, E. & Schlittler, R. R. Observation of a chemical reaction using a micromechanical sensor. Chemical Physics Letters 217, 589–594 (1994).
Dumas, P. et al. Photon spectroscopy, mapping, and topography of 85% porous silicon. Journal of Vacuum Science & Technology B 12, 2064–2066 (1994).
Dumas, P. et al. Photon spectroscopy, mapping, and topography of 85% porous silicon. Journal of Vacuum Science & Technology B 12, 2064–2066 (1994).
Dumas, P. et al. Photon spectroscopy, mapping, and topography of 85% porous silicon. Journal of Vacuum Science & Technology B 12, 2064–2066 (1994).
Dumaks, P. et al. Photon Spectroscopy, Mapping, and Topography of 85-Percent Porous Silicon. Journal of Vacuum Science & Technology B 12, 2064–2066 (1994).
Dumaks, P. et al. Photon Spectroscopy, Mapping, and Topography of 85-Percent Porous Silicon. Journal of Vacuum Science & Technology B 12, 2064–2066 (1994).
Dumaks, P. et al. Photon Spectroscopy, Mapping, and Topography of 85-Percent Porous Silicon. Journal of Vacuum Science & Technology B 12, 2064–2066 (1994).
Gimzewski, J. K., Modesti, S., David, T. & Schlittler, R. R. Scanning tunneling microscopy of ordered C60 and C70 layers on Au (111), Cu (111), Ag (110), and Au (110) surfaces. Journal of Vacuum Science & Technology B 12, 1942–1946 (1994).
Modesti, S., Gimzewski, J. K. & Schlittler, R. R. Stable and metastable reconstructions at the C sub 60/Au (110) interface. Surf. Sci.(The Netherlands) 331, 1129–1135 (1994).
1995
Murray, P. W. et al. Ultimate Limits of Fabrication and Measurement 189–196 (Springer Netherlands, 1995).
Gerber, C., Gimzewski, J., Reihl, B., SCHLITTLER, R. & ,. APPARATUS AND METHOD FOR SPECTROSCOPIC MEASUREMENTS. (1995).
Berndt, R. et al. Atomic resolution in photon emission induced by a scanning tunneling microscope. Physical review letters 74, 102 (1995).
Berndt, R. et al. Atomic resolution in photon emission induced by a scanning tunneling microscope. Physical review letters 74, 102 (1995).
Gerber, C., Gimzewski, J., Reihl, B., SCHLITTLER, R. & ,. CALORIMETRIC SENSOR. (1995).
Joachim, C., Gimzewski, J. K., Schlittler, R. R. & Chavy, C. Electronic transparence of a single C 60 molecule. Physical review letters 74, 2102 (1995).
Joachim, C., Gimzewski, J. K., Schlittler, R. R. & Chavy, C. Electronic Transparence of a Single ${\mathrm{C}}_{60}$ Molecule. Phys. Rev. Lett. 74, 2102–2105 (1995).
, et al. Erratum: A femtojoule calorimeter using micromechanical sensors [Rev. Sci. Instrum. 65, 3793 (1994)]. Review of Scientific Instruments 66, 3083–3083 (1995).
Murray, P. W. et al. l-> 3 DIMENSIONAL STRUCTURES ON A UNI-DIRECTION AL SUBSTRATE. (1995).
Meyer, E., Gimzewski, J. K., Gerber, C. & Schlittler, R. R. Ultimate Limits of Fabrication and Measurement 89–95 (Springer Netherlands, 1995).
Gimzewski, J. K., Gerber, C., Meyer, E. & Schlittler, R. R. Forces in Scanning Probe Methods 123–131 (Springer Netherlands, 1995).
Jung, T., Schlittler, R., Gimzewski, J. K. & Himpsel, F. J. One-dimensional metal structures at decorated steps. Applied Physics A 61, 467–474 (1995).
Modesti, S., Gimzewski, J. K. & Schlittler, R. R. Stable and metastable reconstructions at the C< sub> 60/Au (110) interface. Surface science 331, 1129–1135 (1995).

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