Publications

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Martin-Olmos, C., Stieg, A. Z. & Gimzewski, J. K. Electrostatic force microscopy as a broadly applicable method for characterizing pyroelectric materials. Nanotechnology 23, 235701 (2012).
Martin-Olmos, C., Rasool, H. Imad, Weiller, B. H. & Gimzewski, J. K. Graphene MEMS: AFM probe performance improvement. ACS nano 7, 4164–4170 (2013).