Publications

Found 56 results
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Filters: Author is Schlittler, RR  [Clear All Filters]
Book Chapter
Gimzewski, J. K., Gerber, C., Meyer, E. & Schlittler, R. R. Forces in Scanning Probe Methods 123–131 (Springer Netherlands, 1995).
Meyer, E., Gimzewski, J. K., Gerber, C. & Schlittler, R. R. Ultimate Limits of Fabrication and Measurement 89–95 (Springer Netherlands, 1995).
Gimzewski, J. K., Jung, T., Cuberes, M. T., Schlittler, R. R. & Joachim, C. Micro/Nanotribology and Its Applications 299–309 (Springer Netherlands, 1997).
Gimzewski, J. K., Berndt, R. & Schlittler, R. R. Nanosources and Manipulation of Atoms Under High Fields and Temperatures: Applications 219–228 (Springer Netherlands, 1993).
Jung, T. A., Himpsel, F. J., Schlittler, R. R. & Gimzewski, J. K. Scanning Probe Microscopy 11–48 (Springer Berlin Heidelberg, 1998).
Murray, P. W. et al. Ultimate Limits of Fabrication and Measurement 189–196 (Springer Netherlands, 1995).

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