Found 4 resultsAuthor Title [ Type] Year
Filters: Author is McKinnon, AW [Clear All Filters]
Spatially resolved electrical measurements of SiO2 gate oxides using atomic force microscopy. Applied physics letters 62, 786–788 (1993).
Photon-emission scanning tunneling microscopy of silver films in ultrahigh vacuum: A spectroscopic method. Physical Review B 48, 15250 (1993).
Near Field Optics 333–340 (Springer Netherlands, 1993).