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Filters: Author is Wong, TMH [Clear All Filters]
Spatially resolved electrical measurements of SiO2 gate oxides using atomic force microscopy. Applied physics letters 62, 786–788 (1993).
Photon-emission scanning tunneling microscopy of silver films in ultrahigh vacuum: A spectroscopic method. Physical Review B 48, 15250 (1993).
Near Field Optics 333–340 (Springer Netherlands, 1993).