Publications

Found 260 results
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Book Chapter
Gimzewski, J. K. et al. Near Field Optics 333–340 (Springer Netherlands, 1993).
Gimzewski, J. K. et al. Near Field Optics 333–340 (Springer Netherlands, 1993).
Gimzewski, J. K. et al. Near Field Optics 333–340 (Springer Netherlands, 1993).
Fabian, J. - H. et al. Micro Total Analysis Systems’ 9 117–120 (Springer Netherlands, 1998).
Gimzewski, J. K., Gerber, C., Meyer, E. & Schlittler, R. R. Forces in Scanning Probe Methods 123–131 (Springer Netherlands, 1995).
Meyer, E., Gimzewski, J. K., Gerber, C. & Schlittler, R. R. Ultimate Limits of Fabrication and Measurement 89–95 (Springer Netherlands, 1995).
Gimzewski, J. K., Jung, T., Cuberes, M. T., Schlittler, R. R. & Joachim, C. Micro/Nanotribology and Its Applications 299–309 (Springer Netherlands, 1997).
Gimzewski, J. K., Berndt, R. & Schlittler, R. R. Nanosources and Manipulation of Atoms Under High Fields and Temperatures: Applications 219–228 (Springer Netherlands, 1993).
Jung, T. A., Himpsel, F. J., Schlittler, R. R. & Gimzewski, J. K. Scanning Probe Microscopy 11–48 (Springer Berlin Heidelberg, 1998).
Murray, P. W. et al. Ultimate Limits of Fabrication and Measurement 189–196 (Springer Netherlands, 1995).

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