Publications

Found 3 results
Author [ Title(Desc)] Type Year
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E
Battiston, F. et al. E. MEYER, M. GUGGISBERG, CH. LOPPACHER. Impact of Electron and Scanning Probe Microscopy on Materials Research 339 (1999).
N
Meyer, E. et al. Impact of Electron and Scanning Probe Microscopy on Materials Research 339–357 (Springer Netherlands, 1999).
S
Berndt, R., Baratoff, A. & Gimzewski, J. K. Scanning Tunneling Microscopy and Related Methods 269–280 (Springer Netherlands, 1990).