Publications

Found 14 results
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David, T., Gimzewski, J. K., Purdie, D., Reihl, B. & Schlittler, R. R. Epitaxial growth of C 60 on Ag (110) studied by scanning tunneling microscopy and tunneling spectroscopy. Physical Review B 50, 5810 (1994).
Demming, A., Gimzewski, J. K. & Vuillaume, D. Synaptic electronics. Nanotechnology 24, 380201 (2013).
Dorig, O., Gimzewski, J., Rao, J., Sharma, S. & Santiskulvong, C. Nanomechanical biomarkers for disease therapy. (2013).
Duerig, U. T., Gimewski, J. K., Greschner, J., Pohl, W. D. & Wolter, O. Micromechanical atomic force sensor head. (1989).
Duerig, U. T., Gimzewski, J. K. & Pohl, W. D. Direct access storage unit using tunneling current techniques. (1989).
Dumaks, P. et al. Photon Spectroscopy, Mapping, and Topography of 85-Percent Porous Silicon. Journal of Vacuum Science & Technology B 12, 2064–2066 (1994).
Dumas, P. et al. Nanostructuring of porous silicon using scanning tunneling microscopy. Journal of Vacuum Science & Technology B 12, 2067–2069 (1994).
Dumas, P. et al. Photon spectroscopy, mapping, and topography of 85% porous silicon. Journal of Vacuum Science & Technology B 12, 2064–2066 (1994).
Dumas, P. et al. Optical Properties of Low Dimensional Silicon Structures 157–162 (Springer Netherlands, 1993).
Dumas, P. et al. Direct observation of individual nanometer-sized light-emitting structures on porous silicon surfaces. EPL (Europhysics Letters) 23, 197 (1993).
Dürig, U., Gimzewski, J. K., Pohl, D. W. & Schlittler, R. Force Sensing in Scanning Tunneling Microscopy. IBM, Rüschlikon 1 (1986).
Dürig, D. et al. Micromechanical atomic force sensor head. (1988).
Dürig, U., Gimzewski, J. K. & Pohl, D. W. Experimental observation of forces acting during scanning tunneling microscopy. Physical review letters 57, 2403 (1986).
Dürig, D., Gimzewski, D., Kazimierz, J., Rohrer, D. & ,. Atomic force sensor head for investigating the topography of a surface. (1992).