Found 4 resultsAuthor [ Title] Type Year
Filters: Author is Battiston, F [Clear All Filters]
Sensor Technology in the Netherlands: State of the Art 33–42 (Springer Netherlands, 1998).
Impact of Electron and Scanning Probe Microscopy on Materials Research 339–357 (Springer Netherlands, 1999).
E. MEYER, M. GUGGISBERG, CH. LOPPACHER. Impact of Electron and Scanning Probe Microscopy on Materials Research 339 (1999).
A chemical sensor based on a micromechanical cantilever array for the identification of gases and vapors. Applied Physics A: Materials Science & Processing 66, S61–S64 (1998).