Found 4 resultsAuthor Title [ Type] Year
Filters: First Letter Of Last Name is B and Author is Battiston, F [Clear All Filters]
Impact of Electron and Scanning Probe Microscopy on Materials Research 339–357 (Springer Netherlands, 1999).
Sensor Technology in the Netherlands: State of the Art 33–42 (Springer Netherlands, 1998).
A chemical sensor based on a micromechanical cantilever array for the identification of gases and vapors. Applied Physics A: Materials Science & Processing 66, S61–S64 (1998).
E. MEYER, M. GUGGISBERG, CH. LOPPACHER. Impact of Electron and Scanning Probe Microscopy on Materials Research 339 (1999).