Publications

Found 134 results
Author Title [ Type(Asc)] Year
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Conference Paper
Berndt, R. & Gimzewski, J. K. Photon Emission from C60 in a Nanoscopic Cavity. Proceedings of the NATO Advanced Research Workshop: (Humboldt-Universität zu Berlin, 1994).
Zhang, W. et al. ORGN 414-Folding polyrotaxanes using secondary noncovalent bonding interactions. ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY 235, (AMER CHEMICAL SOC 1155 16TH ST, NW, WASHINGTON, DC 20036 USA, 2008).
Lang, H. P. et al. The nanomechanical NOSE. Micro Electro Mechanical Systems, 1999. MEMS'99. Twelfth IEEE International Conference on 9–13 (IEEE, 1999).
Lang, H. P. et al. The nanomechanical NOSE. Micro Electro Mechanical Systems, 1999. MEMS'99. Twelfth IEEE International Conference on 9–13 (IEEE, 1999).
Lang, H. P. et al. The nanomechanical NOSE. Micro Electro Mechanical Systems, 1999. MEMS'99. Twelfth IEEE International Conference on 9–13 (IEEE, 1999).
Lang, H. P. et al. The nanomechanical NOSE. Micro Electro Mechanical Systems, 1999. MEMS'99. Twelfth IEEE International Conference on 9–13 (IEEE, 1999).
Khuri-Yakub, B. T. et al. 6D-1 The Capacitive Micromachined Ultrasonic Transducer (CMUT) as a Chem/Bio Sensor. Ultrasonics Symposium, 2007. IEEE 472–475 (IEEE, 2007).
Book Chapter
Berger, R. et al. Sensor Technology in the Netherlands: State of the Art 33–42 (Springer Netherlands, 1998).
Berger, R. et al. Sensor Technology in the Netherlands: State of the Art 33–42 (Springer Netherlands, 1998).
Berger, R. et al. Sensor Technology in the Netherlands: State of the Art 33–42 (Springer Netherlands, 1998).
Berger, R. et al. Sensor Technology in the Netherlands: State of the Art 33–42 (Springer Netherlands, 1998).
Berndt, R., Baratoff, A. & Gimzewski, J. K. Scanning Tunneling Microscopy and Related Methods 269–280 (Springer Netherlands, 1990).
Berndt, R., Baratoff, A. & Gimzewski, J. K. Scanning Tunneling Microscopy and Related Methods 269–280 (Springer Netherlands, 1990).
Gimzewski, J. K. et al. Near Field Optics 333–340 (Springer Netherlands, 1993).
Meyer, E. et al. Impact of Electron and Scanning Probe Microscopy on Materials Research 339–357 (Springer Netherlands, 1999).
Meyer, E. et al. Impact of Electron and Scanning Probe Microscopy on Materials Research 339–357 (Springer Netherlands, 1999).
Meyer, E. et al. Impact of Electron and Scanning Probe Microscopy on Materials Research 339–357 (Springer Netherlands, 1999).
Meyer, E. et al. Impact of Electron and Scanning Probe Microscopy on Materials Research 339–357 (Springer Netherlands, 1999).
Fabian, J. - H. et al. Micro Total Analysis Systems’ 9 117–120 (Springer Netherlands, 1998).
Gimzewski, J. K., Berndt, R. & Schlittler, R. R. Nanosources and Manipulation of Atoms Under High Fields and Temperatures: Applications 219–228 (Springer Netherlands, 1993).
Lang, H. P. et al. Micro Total Analysis Systems’ 9 57–60 (Springer Netherlands, 1998).
Lang, H. P. et al. Micro Total Analysis Systems’ 9 57–60 (Springer Netherlands, 1998).
Lang, H. P. et al. Micro Total Analysis Systems’ 9 57–60 (Springer Netherlands, 1998).
Lang, H. P. et al. Micro Total Analysis Systems’ 9 57–60 (Springer Netherlands, 1998).
Berndt, R. & Gimzewski, J. K. Atomic and Nanometer-Scale Modification of Materials: Fundamentals and Applications 327–335 (Springer Netherlands, 1993).

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