Found 48 results
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Stieg, A. Z. et al. Memristor Networks 173–209 (Springer International Publishing, 2014).
Stieg, A. Z. et al. Self-organized atomic switch networks. Japanese Journal of Applied Physics 53, 01AA02 (2014).
Ohno, T. et al. Sensory and short-term memory formations observed in a Ag2S gap-type atomic switch. Applied Physics Letters 99, 203108 (2011).
Ohno, T. et al. Short-term plasticity and long-term potentiation mimicked in single inorganic synapses. Nature materials 10, 591–595 (2011).
Hsueh, C., Reed, J. & Gimzewski, J. K. Single molecule gene expression profiling using atomic force microscopy. ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY 241, (AMER CHEMICAL SOC 1155 16TH ST, NW, WASHINGTON, DC 20036 USA, 2011).
Reed, J. et al. Single molecule transcription profiling with AFM. Nanotechnology 18, 044032 (2007).
Gimzewski, J. K. Single-Wall Carbon Nanotube Crystals. APS Meeting Abstracts 1, 25001 (2002).
Langlais, V. J. et al. Spatially resolved tunneling along a molecular wire. Physical review letters 83, 2809 (1999).
Lang, H. P. et al. Sequential position readout from arrays of micromechanical cantilever sensors. Applied Physics Letters 72, 383–385 (1998).
Schaffner, M. - H. et al. Size-dependent light emission from mass-selected clusters. The European Physical Journal D-Atomic, Molecular, Optical and Plasma Physics 2, 79–82 (1998).
Cuberes, M. T., Schlittler, R. R. & Gimzewski, J. K. Supramolecular assembly of individual C 60 molecules on a monolayer of 4, 4′-dimethylbianthrone molecules. Applied Physics A: Materials Science & Processing 66, S745–S748 (1998).
Berger, R. et al. Surface stress in the self-assembly of alkanethiols on gold probed. by a force microscopy technique. Applied Physics A: Materials Science & Processing 66, S55–S59 (1998).
Gimzewski, J. K. Scanning tunneling and local probe studies of fullerenes. NATO ASI Series E Applied Sciences-Advanced Study Institute 316, 117–138 (1996).
Dumas, P. et al. Optical Properties of Low Dimensional Silicon Structures 157–162 (Springer Netherlands, 1993).
Gimzewski, J. K. Scanning tunneling microscopy. Le Journal de Physique IV 3, C7–41 (1993).
Murrell, M. P. et al. Spatially resolved electrical measurements of SiO2 gate oxides using atomic force microscopy. Applied physics letters 62, 786–788 (1993).
Gimzewski, J. K. Electron crystallography of organic molecules 203–215 (Springer Netherlands, 1991).
Sass, J. K. & Gimzewski, J. K. Solvent dynamical effects in scanning tunneling microscopy with a polar liquid in the gap. Journal of electroanalytical chemistry and interfacial electrochemistry 308, 333–337 (1991).
Pohl, D. W. & Gimzewski, J. K. Scanning near-field microscopies. 15th Int'l Optics in Complex Sys. Garmisch, FRG 480–484 (International Society for Optics and Photonics, 1990).
Berndt, R., Baratoff, A. & Gimzewski, J. K. Scanning Tunneling Microscopy and Related Methods 269–280 (Springer Netherlands, 1990).
Gimzewski, J. K. Scanning tunneling microscopic techniques applied to roughness of silver surfaces. 1988 Intl Congress on Optical Science and Engineering 274–280 (International Society for Optics and Photonics, 1989).
Gimzewski, J. K., Humbert, A., Pohl, D. W. & Veprek, S. Scanning tunneling microscopy of nanocrystalline silicon surfaces. Surface Science 168, 795–800 (1986).
Gimzewski, J. K. & Humbert, A. Scanning tunneling microscopy of surface microstructure on rough surfaces. IBM journal of research and development 30, 472–477 (1986).
Pohl, D. W., Gimzewski, J. K., Humbert, A. & Vepek, S. Surface Topography Studies Of Nanocrystalline Si by STM. 29th Annual Technical Symposium 98–101 (International Society for Optics and Photonics, 1986).
Hofmann, F. et al. Scrape-off measurements during Alfvén wave heating in the TCA tokamak. Journal of Nuclear Materials 121, 22–28 (1984).