Found 6 resultsAuthor Title [ Type] Year
Filters: Author is Pohl, DW [Clear All Filters]
Transition from tunneling to point contact investigated by scanning tunneling microscopy and spectroscopy. Surface Science 189, 15–23 (1987).
Scanning tunneling microscopy of nanocrystalline silicon surfaces. Surface Science 168, 795–800 (1986).
A SCANNING TUNNELING MICROSCOPIC (STM) STUDY OF THE SURFACE TOPOGRAPHY OF PLASMA-DEPOSITED NANOCRYSTALLINE SILICON. (1985).
Force Sensing in Scanning Tunneling Microscopy. IBM, Rüschlikon 1 (1986).
Experimental observation of forces acting during scanning tunneling microscopy. Physical review letters 57, 2403 (1986).
Surface Topography Studies Of Nanocrystalline Si by STM. 29th Annual Technical Symposium 98–101 (International Society for Optics and Photonics, 1986).