Found 13 results[ Author] Title Type Year
Filters: First Letter Of Last Name is M [Clear All Filters]
Spatially resolved electrical measurements of SiO2 gate oxides using atomic force microscopy. Applied physics letters 62, 786–788 (1993).
Ultimate Limits of Fabrication and Measurement 189–196 (Springer Netherlands, 1995).
Templating a face-centered cubic (110) termination of C< sub> 60. Surface science 367, L79–L84 (1996).
Stable and metastable reconstructions at the C< sub> 60/Au (110) interface. Surface science 331, 1129–1135 (1995).
Stable and metastable reconstructions at the C sub 60/Au (110) interface. Surf. Sci.(The Netherlands) 331, 1129–1135 (1994).
Impact of Electron and Scanning Probe Microscopy on Materials Research 339–357 (Springer Netherlands, 1999).
Ultimate Limits of Fabrication and Measurement 89–95 (Springer Netherlands, 1995).
Photon-emission scanning tunneling microscopy of silver films in ultrahigh vacuum: A spectroscopic method. Physical Review B 48, 15250 (1993).
Electrostatic force microscopy as a broadly applicable method for characterizing pyroelectric materials. Nanotechnology 23, 235701 (2012).
Graphene MEMS: AFM probe performance improvement. ACS nano 7, 4164–4170 (2013).