Publications

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Murrell, M. P. et al. Spatially resolved electrical measurements of SiO2 gate oxides using atomic force microscopy. Applied physics letters 62, 786–788 (1993).
Murray, P. W., Gimzewski, J. K., Schlittler, R. R. & Thornton, G. Templating a face-centered cubic (110) termination of C< sub> 60. Surface science 367, L79–L84 (1996).
Murray, P. W. et al. Ultimate Limits of Fabrication and Measurement 189–196 (Springer Netherlands, 1995).
Murray, P. W. et al. l-> 3 DIMENSIONAL STRUCTURES ON A UNI-DIRECTION AL SUBSTRATE. (1995).
Modesti, S., Gimzewski, J. K. & Schlittler, R. R. Stable and metastable reconstructions at the C sub 60/Au (110) interface. Surf. Sci.(The Netherlands) 331, 1129–1135 (1994).
Modesti, S., Gimzewski, J. K. & Schlittler, R. R. Stable and metastable reconstructions at the C< sub> 60/Au (110) interface. Surface science 331, 1129–1135 (1995).
Meyer, E. et al. Impact of Electron and Scanning Probe Microscopy on Materials Research 339–357 (Springer Netherlands, 1999).
Meyer, E., Gimzewski, J. K., Gerber, C. & Schlittler, R. R. Ultimate Limits of Fabrication and Measurement 89–95 (Springer Netherlands, 1995).
Mecklenburg, M. et al. In Situ Heating of Graphene Imaged Using Transmission Electron Microscopy. (Submitted).
McKinnon, A. W. et al. Tip geometry effects in photon emission from the scanning tunnelling microscope. (1992).
McKinnon, A. W., Welland, M. E., Wong, T. M. H. & Gimzewski, J. K. Photon-emission scanning tunneling microscopy of silver films in ultrahigh vacuum: A spectroscopic method. Physical Review B 48, 15250 (1993).
Martin-Olmos, C., Rasool, H. Imad, Weiller, B. H. & Gimzewski, J. K. Graphene MEMS: AFM probe performance improvement. ACS nano 7, 4164–4170 (2013).
Martin-Olmos, C., Stieg, A. Z. & Gimzewski, J. K. Electrostatic force microscopy as a broadly applicable method for characterizing pyroelectric materials. Nanotechnology 23, 235701 (2012).