Found 6 resultsAuthor Title Type [ Year]
Filters: Author is Pohl, DW [Clear All Filters]
Experimental observation of forces acting during scanning tunneling microscopy. Physical review letters 57, 2403 (1986).
Force Sensing in Scanning Tunneling Microscopy. IBM, Rüschlikon 1 (1986).
Scanning tunneling microscopy of nanocrystalline silicon surfaces. Surface Science 168, 795–800 (1986).
Surface Topography Studies Of Nanocrystalline Si by STM. 29th Annual Technical Symposium 98–101 (International Society for Optics and Photonics, 1986).
Transition from tunneling to point contact investigated by scanning tunneling microscopy and spectroscopy. Surface Science 189, 15–23 (1987).