Found 30 results
Author Title [ Type(Asc)] Year
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Journal Article
Bomben, K. D., Gimzewski, J. K. & Thomas, T. D. Extra-atomic relaxation in HCl, ClF, and Cl2 from x-ray photoelectron spectroscopy. The Journal of Chemical Physics 78, 5437–5442 (1983).
Bomben, K. D., Bahl, M. K., Gimzewski, J. K., Chambers, S. A. & Thomas, T. D. Extended-x-ray-absorption fine-structure amplitude attenuation in Br 2: Relationship to satellites in the x-ray photoelectron spectrum. Physical Review A 20, 2405 (1979).
Dürig, U., Gimzewski, J. K. & Pohl, D. W. Experimental observation of forces acting during scanning tunneling microscopy. Physical review letters 57, 2403 (1986).
Fabian, D. J., Gimzewski, J. K., Barrie, A. & Dev, B. Excitation of Fe 1s core-level photoelectrons with synchrotron radiation. Journal of Physics F: Metal Physics 7, L345 (1977).
Cross, S. E. et al. Evaluation of bacteria-induced enamel demineralization using optical profilometry. dental materials 25, 1517–1526 (2009).
Han, T. H. & Liao, J. C. Erythrocyte nitric oxide transport reduced by a submembrane cytoskeletal barrier. Biochimica et Biophysica Acta (BBA)-General Subjects 1723, 135–142 (2005).
, et al. Erratum: A femtojoule calorimeter using micromechanical sensors [Rev. Sci. Instrum. 65, 3793 (1994)]. Review of Scientific Instruments 66, 3083–3083 (1995).
David, T., Gimzewski, J. K., Purdie, D., Reihl, B. & Schlittler, R. R. Epitaxial growth of C 60 on Ag (110) studied by scanning tunneling microscopy and tunneling spectroscopy. Physical Review B 50, 5810 (1994).
Gimzewski, J. K., Sass, J. K., Schlitter, R. R. & Schott, J. Enhanced photon emission in scanning tunnelling microscopy. EPL (Europhysics Letters) 8, 435 (1989).
Berndt, R., Gimzewski, J. K. & Schlittler, R. R. Enhanced photon emission from the STM: a general property of metal surfaces. Ultramicroscopy 42, 355–359 (1992).
Stieg, A. Z. et al. Emergent Criticality in Complex Turing B-Type Atomic Switch Networks. Advanced Materials 24, 286–293 (2012).
Martin-Olmos, C., Stieg, A. Z. & Gimzewski, J. K. Electrostatic force microscopy as a broadly applicable method for characterizing pyroelectric materials. Nanotechnology 23, 235701 (2012).
Joachim, C., Gimzewski, J. K. & Aviram, A. Electronics using hybrid-molecular and mono-molecular devices. Nature 408, 541–548 (2000).
Joachim, C., Gimzewski, J. K., Schlittler, R. R. & Chavy, C. Electronic Transparence of a Single ${\mathrm{C}}_{60}$ Molecule. Phys. Rev. Lett. 74, 2102–2105 (1995).
Joachim, C., Gimzewski, J. K., Schlittler, R. R. & Chavy, C. Electronic transparence of a single C 60 molecule. Physical review letters 74, 2102 (1995).
Fornaro, P. et al. AN ELECTRONIC NOSE BASED ON A MICROMECHANICAL CANTILEVER ARRAY. Micro Total Analysis Systems' 98: Proceedings of the Utas' 98 Workshop, Held in Banff, Canada, 13-16 October 1998 57 (1998).
Aitken, E. J. et al. Electron spectroscopic investigations of the influence of initial-and final-state effects on electronegativity. Journal of the American Chemical Society 102, 4873–4879 (1980).
Joachim, C. & Gimzewski, J. K. An electromechanical amplifier using a single molecule. Chemical Physics Letters 265, 353–357 (1997).
Berndt, R., Gimzewski, J. K. & Johansson, P. Electromagnetic interactions of metallic objects in nanometer proximity. Physical review letters 71, 3493 (1993).
Brewer, R. J., Gimzewski, J. K., Veprek, S. & Stuessi, H. Effect of surface contamination and pretreatment on the hydrogen diffusion into and out of titanium under plasma conditions. Journal of Nuclear Materials 103, 465–469 (1981).
Battiston, F. et al. E. MEYER, M. GUGGISBERG, CH. LOPPACHER. Impact of Electron and Scanning Probe Microscopy on Materials Research 339 (1999).
Book Chapter
Lang, H. P. et al. Micro Total Analysis Systems’ 9 57–60 (Springer Netherlands, 1998).