Publications

Found 6 results
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Gimzewski, J. K., Möller, R., Pohl, D. W. & Schlittler, R. R. Transition from tunneling to point contact investigated by scanning tunneling microscopy and spectroscopy. Surface Science 189, 15–23 (1987).
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Pohl, D. W., Gimzewski, J. K., Humbert, A. & Vepek, S. Surface Topography Studies Of Nanocrystalline Si by STM. 29th Annual Technical Symposium 98–101 (International Society for Optics and Photonics, 1986).
Gimzewski, J. K., Humbert, A., Pohl, D. W. & Veprek, S. Scanning tunneling microscopy of nanocrystalline silicon surfaces. Surface Science 168, 795–800 (1986).
Gimzewski, J. K., Humbert, A., Pohl, D. W. & Vepfek, S. A SCANNING TUNNELING MICROSCOPIC (STM) STUDY OF THE SURFACE TOPOGRAPHY OF PLASMA-DEPOSITED NANOCRYSTALLINE SILICON. (1985).
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Dürig, U., Gimzewski, J. K., Pohl, D. W. & Schlittler, R. Force Sensing in Scanning Tunneling Microscopy. IBM, Rüschlikon 1 (1986).
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Dürig, U., Gimzewski, J. K. & Pohl, D. W. Experimental observation of forces acting during scanning tunneling microscopy. Physical review letters 57, 2403 (1986).