Publications

Found 9 results
Author [ Title(Asc)] Type Year
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Gimzewski, J. K. & Welland, M. E. Ultimate Limits of Fabrication and Measurements. NATO ASI Series 292, (1995).
T
McKinnon, A. W. et al. Tip geometry effects in photon emission from the scanning tunnelling microscope. (1992).
S
Murrell, M. P. et al. Spatially resolved electrical measurements of SiO2 gate oxides using atomic force microscopy. Applied physics letters 62, 786–788 (1993).
Schlittler, R. R. et al. Single crystals of single-walled carbon nanotubes formed by self-assembly. Science 292, 1136–1139 (2001).
P
Welland, M. E., Miles, M. J. & Gimzewski, J. K. Probe Microscopy: Editorial. Probe Microscopy 1, 1–1 (1997).
McKinnon, A. W., Welland, M. E., Wong, T. M. H. & Gimzewski, J. K. Photon-emission scanning tunneling microscopy of silver films in ultrahigh vacuum: A spectroscopic method. Physical Review B 48, 15250 (1993).
O
Gimzewski, J. K. et al. Near Field Optics 333–340 (Springer Netherlands, 1993).
F
, et al. A femtojoule calorimeter using micromechanical sensors. Review of Scientific Instruments 65, 3793–3798 (1994).
E
, et al. Erratum: A femtojoule calorimeter using micromechanical sensors [Rev. Sci. Instrum. 65, 3793 (1994)]. Review of Scientific Instruments 66, 3083–3083 (1995).