Publications

Found 3 results
Author [ Title(Desc)] Type Year
Filters: Author is Klug, William  [Clear All Filters]
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A
Reed, J. et al. Applications of imaging interferometry. SPIE Optics+ Photonics 629301–629301 (International Society for Optics and Photonics, 2006).
M
Rasool, H., Ophus, C., Klug, W., Zettl, A. & Gimzewski, J. Measuring the Strength of Single Crystal and Polycrystalline Graphene. Bulletin of the American Physical Society (2014).
O
Reed, J., Wilkinson, P., Schmit, J., Klug, W. & Gimzewski, J. K. Observation of nanoscale dynamics in cantilever sensor arrays. Nanotechnology 17, 3873 (2006).