Publications

Found 4 results
Author [ Title(Asc)] Type Year
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T
McKinnon, A. W. et al. Tip geometry effects in photon emission from the scanning tunnelling microscope. (1992).
S
Murrell, M. P. et al. Spatially resolved electrical measurements of SiO2 gate oxides using atomic force microscopy. Applied physics letters 62, 786–788 (1993).
P
McKinnon, A. W., Welland, M. E., Wong, T. M. H. & Gimzewski, J. K. Photon-emission scanning tunneling microscopy of silver films in ultrahigh vacuum: A spectroscopic method. Physical Review B 48, 15250 (1993).
O
Gimzewski, J. K. et al. Near Field Optics 333–340 (Springer Netherlands, 1993).