Publications

Found 468 results
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1993
Gimzewski, J. K., VATEL, O. & Hallimaoui, A. Ph. DUMAS*, M. GU*, C. SYRYKH*, F. SALVAN*,* GPEC, URA CNRS 783, Fac. de Luminy, 13288, Marseille Cedex 9, France. Optical Properties of Low Dimensional Silicon Structures: Proceedings of the NATO Advanced Research Workshop, Meylan, France, March 1-3, 1993 244, 157 (1993).
Berndt, R. R. J. K. B. R. R. W. D. M. et al. Photon emission at molecular resolution induced by a scanning tunneling microscope. Science 262, 1425–1427 (1993).
Berndt, R. R. J. K. B. R. R. W. D. M. et al. Photon emission at molecular resolution induced by a scanning tunneling microscope. Science 262, 1425–1427 (1993).
Berndt, R. et al. Photon emission from adsorbed C60 molecules with sub-nanometer lateral resolution. Applied Physics A 57, 513–516 (1993).
Berndt, R. et al. Photon emission from adsorbed C60 molecules with sub-nanometer lateral resolution. Applied Physics A 57, 513–516 (1993).
Berndt, R., Gimzewski, J. K. & Schlittler, R. R. Photon emission from nanostructures in an STM. Nanostructured Materials 3, 345–348 (1993).
Berndt, R., Gimzewski, J. K. & Schlittler, R. R. Photon emission from small particles in an STM. Zeitschrift für Physik D Atoms, Molecules and Clusters 26, 87–88 (1993).
Berndt, R. & Gimzewski, J. K. Photon emission from transition metal surfaces in scanning tunneling microscopy. International Journal of Modern Physics B 7, 516–519 (1993).
Berndt, R. & Gimzewski, J. K. Photon emission in scanning tunneling microscopy: Interpretation of photon maps of metallic systems. Physical Review B 48, 4746 (1993).
McKinnon, A. W., Welland, M. E., Wong, T. M. H. & Gimzewski, J. K. Photon-emission scanning tunneling microscopy of silver films in ultrahigh vacuum: A spectroscopic method. Physical Review B 48, 15250 (1993).
Dumas, P. et al. Optical Properties of Low Dimensional Silicon Structures 157–162 (Springer Netherlands, 1993).
Dumas, P. et al. Optical Properties of Low Dimensional Silicon Structures 157–162 (Springer Netherlands, 1993).
Gimzewski, J. K. Scanning tunneling microscopy. Le Journal de Physique IV 3, C7–41 (1993).
1994
Berndt, R., Gimzewski, J. K. & Schlittler, R. R. Bias-dependent STM images of oxygen-induced structures on Ti (0001) facets. Surface science 310, 85–88 (1994).
Joachim, C. & Gimzewski, J. K. CONTACTING A SINGLE C60 MOLECULE. Proceedings of the NATO Advanced Research Workshop: (Humboldt-Universität zu Berlin, 1994).
Gimzewski, J. K., Modesti, S. & Schlittler, R. R. Cooperative self-assembly of Au atoms and C 60 on Au (110) surfaces. Physical review letters 72, 1036 (1994).
David, T., Gimzewski, J. K., Purdie, D., Reihl, B. & Schlittler, R. R. Epitaxial growth of C 60 on Ag (110) studied by scanning tunneling microscopy and tunneling spectroscopy. Physical Review B 50, 5810 (1994).
, et al. A femtojoule calorimeter using micromechanical sensors. Review of Scientific Instruments 65, 3793–3798 (1994).
, et al. A femtojoule calorimeter using micromechanical sensors. Review of Scientific Instruments 65, 3793–3798 (1994).
Gaisch, R. et al. Internal structure of C60 on Au (110) as observed by low-temperature scanning tunneling microscopy. Journal of Vacuum Science & Technology B 12, 2153–2155 (1994).
Gaisch, R. et al. Internal structure of C60 on Au (110) as observed by low-temperature scanning tunneling microscopy. Journal of Vacuum Science & Technology B 12, 2153–2155 (1994).
Reihl, B. et al. Low-temperature scanning tunneling microscopy. Physica B: Condensed Matter 197, 64–71 (1994).
Reihl, B. et al. Low-temperature scanning tunneling microscopy. Physica B: Condensed Matter 197, 64–71 (1994).
Gimzewski, D., Parrinello, P., Reihl, D. & ,. Molecular recording/reproducing method and recording medium. (1994).
Dumas, P. et al. Nanostructuring of porous silicon using scanning tunneling microscopy. Journal of Vacuum Science & Technology B 12, 2067–2069 (1994).
Dumas, P. et al. Nanostructuring of porous silicon using scanning tunneling microscopy. Journal of Vacuum Science & Technology B 12, 2067–2069 (1994).
Gimzewski, J. K., Gerber, C., Meyer, E. & Schlittler, R. R. Observation of a chemical reaction using a micromechanical sensor. Chemical Physics Letters 217, 589–594 (1994).
Gimzewski, J. K., Gerber, C., Meyer, E. & Schlittler, R. R. Observation of a chemical reaction using a micromechanical sensor. Chemical Physics Letters 217, 589–594 (1994).
Berndt, R. & Gimzewski, J. K. Photon Emission from C60 in a Nanoscopic Cavity. Proceedings of the NATO Advanced Research Workshop: (Humboldt-Universität zu Berlin, 1994).
Dumas, P. et al. Photon spectroscopy, mapping, and topography of 85% porous silicon. Journal of Vacuum Science & Technology B 12, 2064–2066 (1994).
Dumas, P. et al. Photon spectroscopy, mapping, and topography of 85% porous silicon. Journal of Vacuum Science & Technology B 12, 2064–2066 (1994).
Dumaks, P. et al. Photon Spectroscopy, Mapping, and Topography of 85-Percent Porous Silicon. Journal of Vacuum Science & Technology B 12, 2064–2066 (1994).
Dumaks, P. et al. Photon Spectroscopy, Mapping, and Topography of 85-Percent Porous Silicon. Journal of Vacuum Science & Technology B 12, 2064–2066 (1994).
Galaxy, I. Photothermal spectroscopy with femtojoule sensitivity using a micromechanical device. Nature 372, 3 (1994).
Gimzewski, J. K., Modesti, S., David, T. & Schlittler, R. R. Scanning tunneling microscopy of ordered C60 and C70 layers on Au (111), Cu (111), Ag (110), and Au (110) surfaces. Journal of Vacuum Science & Technology B 12, 1942–1946 (1994).
Modesti, S., Gimzewski, J. K. & Schlittler, R. R. Stable and metastable reconstructions at the C sub 60/Au (110) interface. Surf. Sci.(The Netherlands) 331, 1129–1135 (1994).
1995
Murray, P. W. et al. Ultimate Limits of Fabrication and Measurement 189–196 (Springer Netherlands, 1995).
Joachim, C. & Gimzewski, J. K. Analysis of low-voltage I (V) characteristics of a single C60 molecule. EPL (Europhysics Letters) 30, 409 (1995).
Gerber, C., Gimzewski, J., Reihl, B., SCHLITTLER, R. & ,. APPARATUS AND METHOD FOR SPECTROSCOPIC MEASUREMENTS. (1995).
Gerber, C., Gimzewski, J., Reihl, B., SCHLITTLER, R. & ,. APPARATUS AND METHOD FOR SPECTROSCOPIC MEASUREMENTS. (1995).
Berndt, R. et al. Atomic resolution in photon emission induced by a scanning tunneling microscope. Physical review letters 74, 102 (1995).
Berndt, R. et al. Atomic resolution in photon emission induced by a scanning tunneling microscope. Physical review letters 74, 102 (1995).
Gerber, C., Gimzewski, J., Reihl, B., SCHLITTLER, R. & ,. CALORIMETRIC SENSOR. (1995).
Gerber, C., Gimzewski, J., Reihl, B., SCHLITTLER, R. & ,. CALORIMETRIC SENSOR. (1995).
Joachim, C., Gimzewski, J. K., Schlittler, R. R. & Chavy, C. Electronic transparence of a single C 60 molecule. Physical review letters 74, 2102 (1995).
Joachim, C., Gimzewski, J. K., Schlittler, R. R. & Chavy, C. Electronic Transparence of a Single ${\mathrm{C}}_{60}$ Molecule. Phys. Rev. Lett. 74, 2102–2105 (1995).
, et al. Erratum: A femtojoule calorimeter using micromechanical sensors [Rev. Sci. Instrum. 65, 3793 (1994)]. Review of Scientific Instruments 66, 3083–3083 (1995).
, et al. Erratum: A femtojoule calorimeter using micromechanical sensors [Rev. Sci. Instrum. 65, 3793 (1994)]. Review of Scientific Instruments 66, 3083–3083 (1995).
Murray, P. W. et al. l-> 3 DIMENSIONAL STRUCTURES ON A UNI-DIRECTION AL SUBSTRATE. (1995).
Meyer, E., Gimzewski, J. K., Gerber, C. & Schlittler, R. R. Ultimate Limits of Fabrication and Measurement 89–95 (Springer Netherlands, 1995).

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