Found 14 results[ Author] Title Type Year
Filters: First Letter Of Last Name is D [Clear All Filters]
Force Sensing in Scanning Tunneling Microscopy. IBM, Rüschlikon 1 (1986).
Experimental observation of forces acting during scanning tunneling microscopy. Physical review letters 57, 2403 (1986).
Optical Properties of Low Dimensional Silicon Structures 157–162 (Springer Netherlands, 1993).
Direct observation of individual nanometer-sized light-emitting structures on porous silicon surfaces. EPL (Europhysics Letters) 23, 197 (1993).
Nanostructuring of porous silicon using scanning tunneling microscopy. Journal of Vacuum Science & Technology B 12, 2067–2069 (1994).
Photon spectroscopy, mapping, and topography of 85% porous silicon. Journal of Vacuum Science & Technology B 12, 2064–2066 (1994).
Photon Spectroscopy, Mapping, and Topography of 85-Percent Porous Silicon. Journal of Vacuum Science & Technology B 12, 2064–2066 (1994).
Synaptic electronics. Nanotechnology 24, 380201 (2013).
Epitaxial growth of C 60 on Ag (110) studied by scanning tunneling microscopy and tunneling spectroscopy. Physical Review B 50, 5810 (1994).