Found 14 results[ Author] Title Type Year
Filters: First Letter Of Last Name is D [Clear All Filters]
Experimental observation of forces acting during scanning tunneling microscopy. Physical review letters 57, 2403 (1986).
Force Sensing in Scanning Tunneling Microscopy. IBM, Rüschlikon 1 (1986).
Photon spectroscopy, mapping, and topography of 85% porous silicon. Journal of Vacuum Science & Technology B 12, 2064–2066 (1994).
Optical Properties of Low Dimensional Silicon Structures 157–162 (Springer Netherlands, 1993).
Direct observation of individual nanometer-sized light-emitting structures on porous silicon surfaces. EPL (Europhysics Letters) 23, 197 (1993).
Nanostructuring of porous silicon using scanning tunneling microscopy. Journal of Vacuum Science & Technology B 12, 2067–2069 (1994).
Photon Spectroscopy, Mapping, and Topography of 85-Percent Porous Silicon. Journal of Vacuum Science & Technology B 12, 2064–2066 (1994).
Synaptic electronics. Nanotechnology 24, 380201 (2013).
Epitaxial growth of C 60 on Ag (110) studied by scanning tunneling microscopy and tunneling spectroscopy. Physical Review B 50, 5810 (1994).