Padalia, B. D. et al. The reactions of oxygen and water with the rare-earth metals terbium to lutetium studied by x-ray photoelectron spectroscopy. Surface Science 61, 468–482 (1976).

Fabian, D. J., Gimzewski, J. K., Barrie, A. & Dev, B. Excitation of Fe 1s core-level photoelectrons with synchrotron radiation. Journal of Physics F: Metal Physics 7, L345 (1977).

Gimzewski, J. K., Donnelly, T. & Affrossman, S. Interaction of ozone with nickel ions adsorbed on alumina. Journal of Catalysis 47, 79–84 (1977).

ABOU-KAIS, A. N. T. O. I. N. E. et al. IOURNAL OF CATALYSIS 47, 404 (1977). (1977).

Gimzewski, J. K. The Reaction of Gaseous Molecules with Metal Surfaces Studied by X-Ray Photoelectron Spectroscopy. (1977).

Gimzewski, J. K., Padalia, B. D., Affrossman, S., Watson, L. M. & Fabian, D. J. The reaction of oxygen and water with iron films studied by X-Ray photoelectron spectroscopy. Surface Science 62, 386–396 (1977).

Gimzewski, J. K., Fabian, D. J., Watson, L. M. & Affrossman, S. X-ray photoelectron studies of scandium and its hydride and oxide. Journal of Physics F: Metal Physics 7, L305 (1977).

Gimzewski, J. K., Padalia, B. D. & Affrossman, S. XPS study of the interaction of nickel (II) ions with alumina. Journal of Catalysis 55, 250–254 (1978).

III, A. J. Ashe et al. Core-ionization energies and the anomalous basicity of arsabenzene and phosphabenzene. Journal of the American Chemical Society 101, 1764–1767 (1979).

Bomben, K. D., Bahl, M. K., Gimzewski, J. K., Chambers, S. A. & Thomas, T. D. Extended-x-ray-absorption fine-structure amplitude attenuation in Br 2: Relationship to satellites in the x-ray photoelectron spectrum. Physical Review A 20, 2405 (1979).

Gimzewski, J. K., Affrossman, S., Gibson, M. T., Watson, L. M. & Fabian, D. J. Oxidation of scandium by oxygen and water studied by XPS. Surface Science 80, 298–305 (1979).

Aitken, E. J. et al. Electron spectroscopic investigations of the influence of initial-and final-state effects on electronegativity. Journal of the American Chemical Society 102, 4873–4879 (1980).

Groner, P., Gimzewski, J. K. & Veprek, S. Boron and doped boron first wall coatings by plasma CVD. Journal of Nuclear Materials 103, 257–260 (1981).

Brewer, R. J., Gimzewski, J. K., Veprek, S. & Stuessi, H. Effect of surface contamination and pretreatment on the hydrogen diffusion into and out of titanium under plasma conditions. Journal of Nuclear Materials 103, 465–469 (1981).

Groner, P., Gimzewski, J. K. & Veprek, S. BORON AND DOPED BORON 1ST WALL COATINGS BY PLASMA CVD. JOURNAL OF NUCLEAR MATERIALS 103, 257–260 (1982).

Gimzewski, J. K. et al. Plasma surface interactions in the TCA tokamak: a preliminary study using deposition probes. (1982).

Veprek, S. et al. PROPERTIES OF MICROCRYSTALLINE SILICON-ELECTRICAL-CONDUCTIVITY, ELECTRON-SPIN RESONANCE AND THE EFFECT OF GAS-ADSORPTION. HELVETICA PHYSICA ACTA 55, 161–161 (BIRKHAUSER VERLAG AG PO BOX 133 KLOSTERBERG 23, CH-4010 BASEL, SWITZERLAND, 1982).

Gimzewski, J. K. & Veprek, S. DETERMINATION OF THE ENERGIES OF IMPURITY IONS IN A LOW-PRESSURE PLASMA USING PLASMA CHEMICAL ETCHING. HELVETICA PHYSICA ACTA 56, 959–960 (BIRKHAUSER VERLAG AG PO BOX 133 KLOSTERBERG 23, CH-4010 BASEL, SWITZERLAND, 1983).

Bomben, K. D., Gimzewski, J. K. & Thomas, T. D. Extra-atomic relaxation in HCl, ClF, and Cl2 from x-ray photoelectron spectroscopy. The Journal of Chemical Physics 78, 5437–5442 (1983).

Gimzewski, J. K. & Veprek, S. Investigation of the initial stages of oxidation of microcrystalline silicon by means of X-ray photoelectron spectroscopy. Solid state communications 47, 747–751 (1983).

Veprek, S. et al. Properties of microcrystalline silicon. IV. Electrical conductivity, electron spin resonance and the effect of gas adsorption. Journal of Physics C: Solid State Physics 16, 6241 (1983).

Gimzewski, J. K. et al. Scrape-off measurements during Alfvén wave heating in the TCA tokamak. (1983).

Haak, H. W., Sawatzky, G. A., Ungier, L., Gimzewski, J. K. & Thomas, T. D. Core-level electron–electron coincidence spectroscopy. Review of scientific instruments 55, 696–711 (1984).

Yamashita, K., Gimzewski, J. K. & Veprek, S. Hydrogen trapping in zirconium under plasma conditions. Journal of Nuclear Materials 128, 705–707 (1984).

Gimzewski, J. K. et al. Impurity deposition profiles in the plasma edge of the TCA Tokamak. Physica Scripta 30, 271 (1984).

Gimzewski, J. K. & Veprek, S. Investigation of impurity retention, implantation and sputtering phenomena on au and c surfaces exposed to the scrape-off-layer. Journal of Nuclear Materials 128, 703–704 (1984).

Gimzewski, J. K. & Veprek, S. A novel method for the determination of the energies of impurity ions bombarding a solid surface exposed to a low pressure plasma. Journal of Vacuum Science & Technology A 2, 35–39 (1984).

Hofmann, F. et al. Scrape-off measurements during Alfvén wave heating in the TCA tokamak. Journal of Nuclear Materials 121, 22–28 (1984).

Gimzewski, J. K., Humbert, A., Bednorz, J. G. & Reihl, B. A comparative study of coldly-and warmly-condensed Ag films by scanning tunneling microscopy. Surface Science 162, 961–964 (1985).

Humbert, A., Gimzewski, J. K. & Reihl, B. Postannealing of coldly condensed Ag films: Influence of pyridine preadsorption. Physical Review B 32, 4252 (1985).

Gimzewski, J. K., Humbert, A., Pohl, D. W. & Vepfek, S. A SCANNING TUNNELING MICROSCOPIC (STM) STUDY OF THE SURFACE TOPOGRAPHY OF PLASMA-DEPOSITED NANOCRYSTALLINE SILICON. (1985).

Gimzewski, J. K., Humbert, A., Bednorz, J. G. & Reihl, B. Silver films condensed at 300 and 90 K: scanning tunneling microscopy of their surface topography. Physical review letters 55, 951 (1985).

Dürig, U., Gimzewski, J. K. & Pohl, D. W. Experimental observation of forces acting during scanning tunneling microscopy. Physical review letters 57, 2403 (1986).

Dürig, U., Gimzewski, J. K., Pohl, D. W. & Schlittler, R. Force Sensing in Scanning Tunneling Microscopy. IBM, Rüschlikon 1 (1986).

Gimzewski, J. K. et al. Impurity recycling and retention on Au and C surfaces exposed to the scrape-off layer of the TCA tokamak. Journal of Vacuum Science & Technology A 4, 90–96 (1986).

Gimzewski, J. K., Humbert, A., Pohl, D. W. & Veprek, S. Scanning tunneling microscopy of nanocrystalline silicon surfaces. Surface Science 168, 795–800 (1986).

Gimzewski, J. K. & Humbert, A. Scanning tunneling microscopy of surface microstructure on rough surfaces. IBM journal of research and development 30, 472–477 (1986).

Pohl, D. W., Gimzewski, J. K., Humbert, A. & Vepek, S. Surface Topography Studies Of Nanocrystalline Si by STM. 29th Annual Technical Symposium 98–101 (International Society for Optics and Photonics, 1986).

Reihl, B., Gimzewski, J. K., Nicholls, J. M. & Tosatti, E. Unoccupied electronic states of graphite as probed by inverse-photoemission and tunneling spectroscopy. Physical Review B 33, 5770 (1986).

Reihl, B. & Gimzewski, J. K. Field emission scanning Auger microscope (FESAM). Surface Science 189, 36–43 (1987).

Bednorz, J. G., Gimzewski, J. K. & Reihl, B. Field-emission scanning auger electron microscope. (1987).

Gimzewski, J. K. & Pohl, W. D. Scanning tunneling microscope. (1987).

Gimzewski, J. K., Stoll, E. & Schlittler, R. R. Scanning tunneling microscopy of individual molecules of copper phthalocyanine adsorbed on polycrystalline silver surfaces. Surface Science 181, 267–277 (1987).

Gimzewski, J. K. & Möller, R. Transition from the tunneling regime to point contact studied using scanning tunneling microscopy. Physical Review B 36, 1284 (1987).

Gimzewski, J. K., Möller, R., Pohl, D. W. & Schlittler, R. R. Transition from tunneling to point contact investigated by scanning tunneling microscopy and spectroscopy. Surface Science 189, 15–23 (1987).

Coombs, J. H. & Gimzewski, J. K. Fine structure in field emission resonances at surfaces. Journal of Microscopy 152, 841–851 (1988).

Dürig, D. et al. Micromechanical atomic force sensor head. (1988).

Coombs, J. H., Gimzewski, J. K., Reihl, B., Sass, J. K. & Schlittler, R. R. Photon emission experiments with the scanning tunnelling microscope. Journal of Microscopy 152, 325–336 (1988).

Gimzewski, J. K., Reihl, B., Coombs, J. H. & Schlittler, R. R. Photon emission with the scanning tunneling microscope. Zeitschrift für Physik B Condensed Matter 72, 497–501 (1988).

Sass, J. K. & Gimzewski, J. K. Proposal for the simulation of electrochemical charge transfer in the scanning tunneling microscope. Journal of electroanalytical chemistry and interfacial electrochemistry 251, 241–245 (1988).