Publications

Found 16 results
Author [ Title(Desc)] Type Year
Filters: Author is Veprek, S  [Clear All Filters]
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B
Groner, P., Gimzewski, J. K. & Veprek, S. BORON AND DOPED BORON 1ST WALL COATINGS BY PLASMA CVD. JOURNAL OF NUCLEAR MATERIALS 103, 257–260 (1982).
Groner, P., Gimzewski, J. K. & Veprek, S. Boron and doped boron first wall coatings by plasma CVD. Journal of Nuclear Materials 103, 257–260 (1981).
D
Gimzewski, J. K. & Veprek, S. DETERMINATION OF THE ENERGIES OF IMPURITY IONS IN A LOW-PRESSURE PLASMA USING PLASMA CHEMICAL ETCHING. HELVETICA PHYSICA ACTA 56, 959–960 (BIRKHAUSER VERLAG AG PO BOX 133 KLOSTERBERG 23, CH-4010 BASEL, SWITZERLAND, 1983).
E
Brewer, R. J., Gimzewski, J. K., Veprek, S. & Stuessi, H. Effect of surface contamination and pretreatment on the hydrogen diffusion into and out of titanium under plasma conditions. Journal of Nuclear Materials 103, 465–469 (1981).
H
Yamashita, K., Gimzewski, J. K. & Veprek, S. Hydrogen trapping in zirconium under plasma conditions. Journal of Nuclear Materials 128, 705–707 (1984).
I
Gimzewski, J. K. et al. Impurity deposition profiles in the plasma edge of the TCA Tokamak. Physica Scripta 30, 271 (1984).
Gimzewski, J. K. et al. Impurity recycling and retention on Au and C surfaces exposed to the scrape-off layer of the TCA tokamak. Journal of Vacuum Science & Technology A 4, 90–96 (1986).
Gimzewski, J. K. & Veprek, S. Investigation of impurity retention, implantation and sputtering phenomena on au and c surfaces exposed to the scrape-off-layer. Journal of Nuclear Materials 128, 703–704 (1984).
Gimzewski, J. K. & Veprek, S. Investigation of the initial stages of oxidation of microcrystalline silicon by means of X-ray photoelectron spectroscopy. Solid state communications 47, 747–751 (1983).
N
Gimzewski, J. K. & Veprek, S. A novel method for the determination of the energies of impurity ions bombarding a solid surface exposed to a low pressure plasma. Journal of Vacuum Science & Technology A 2, 35–39 (1984).
P
Gimzewski, J. K. et al. Plasma surface interactions in the TCA tokamak: a preliminary study using deposition probes. (1982).
Veprek, S. et al. Properties of microcrystalline silicon. IV. Electrical conductivity, electron spin resonance and the effect of gas adsorption. Journal of Physics C: Solid State Physics 16, 6241 (1983).
Veprek, S. et al. PROPERTIES OF MICROCRYSTALLINE SILICON-ELECTRICAL-CONDUCTIVITY, ELECTRON-SPIN RESONANCE AND THE EFFECT OF GAS-ADSORPTION. HELVETICA PHYSICA ACTA 55, 161–161 (BIRKHAUSER VERLAG AG PO BOX 133 KLOSTERBERG 23, CH-4010 BASEL, SWITZERLAND, 1982).
S
Gimzewski, J. K., Humbert, A., Pohl, D. W. & Veprek, S. Scanning tunneling microscopy of nanocrystalline silicon surfaces. Surface Science 168, 795–800 (1986).
Hofmann, F. et al. Scrape-off measurements during Alfvén wave heating in the TCA tokamak. Journal of Nuclear Materials 121, 22–28 (1984).
Gimzewski, J. K. et al. Scrape-off measurements during Alfvén wave heating in the TCA tokamak. (1983).