Sass, J. K. & Gimzewski, J. K. Solvent dynamical effects in scanning tunneling microscopy with a polar liquid in the gap. Journal of electroanalytical chemistry and interfacial electrochemistry 308, 333–337 (1991).

Sass, J. K., Gimzewski, J. K., Haiss, W., Besocke, K. H. & Lackey, D. Theoretical aspects and experimental results of STM studies in polar liquids. Journal of Physics: Condensed Matter 3, S121 (1991).

Gimzewski, J. K. et al. Investigations of the surface of the amorphous alloy Fe< sub> 80 B< sub> 20 by STM, XPS and AES. Journal of non-crystalline solids 116, 253–261 (1990).

Gimzewski, J. K., Berndt, R. & Schlittler, R. R. Observation of mass transport on Au (110)-(1$\times$ 2) reconstructed surfaces using scanning tunneling microscopy. Surface Science Letters 247, A213 (1990).

Pohl, D. W. & Gimzewski, J. K. Scanning near-field microscopies. 15th Int'l Optics in Complex Sys. Garmisch, FRG 480–484 (International Society for Optics and Photonics, 1990).

Berndt, R., Baratoff, A. & Gimzewski, J. K. Scanning Tunneling Microscopy and Related Methods 269–280 (Springer Netherlands, 1990).

Gimzewski, D., Kazimierz, J., Pohl, D., Dieter, W. & Duerig, D. APPARATUS FOR MANUFACTURING SURFACE STRUCTURES IN THE NANOMETER RANGE. (1989).

Duerig, U. T., Gimzewski, J. K. & Pohl, W. D. Direct access storage unit using tunneling current techniques. (1989).

Gimzewski, J. K., Sass, J. K., Schlitter, R. R. & Schott, J. Enhanced photon emission in scanning tunnelling microscopy. EPL (Europhysics Letters) 8, 435 (1989).

Reihl, B., Coombs, J. H. & Gimzewski, J. K. Local inverse photoemission with the scanning tunneling microscope. Surface Science 211, 156–164 (1989).

Pohl, W. D., Gimzewski, J. K. & Muralt, P. R. Method and apparatus for controlling the flying height of the head in a magnetic storage unit. (1989).

Duerig, U. T., Gimewski, J. K., Greschner, J., Pohl, W. D. & Wolter, O. Micromechanical atomic force sensor head. (1989).

Duerig, U. T., Gimewski, J. K., Greschner, J., Pohl, W. D. & Wolter, O. Micromechanical atomic force sensor head. (1989).

Gimzewski, J. K. Scanning tunneling microscopic techniques applied to roughness of silver surfaces. 1988 Intl Congress on Optical Science and Engineering 274–280 (International Society for Optics and Photonics, 1989).

Coombs, J. H. & Gimzewski, J. K. Fine structure in field emission resonances at surfaces. Journal of Microscopy 152, 841–851 (1988).

Dürig, D. et al. Micromechanical atomic force sensor head. (1988).

Dürig, D. et al. Micromechanical atomic force sensor head. (1988).

Coombs, J. H., Gimzewski, J. K., Reihl, B., Sass, J. K. & Schlittler, R. R. Photon emission experiments with the scanning tunnelling microscope. Journal of Microscopy 152, 325–336 (1988).

Gimzewski, J. K., Reihl, B., Coombs, J. H. & Schlittler, R. R. Photon emission with the scanning tunneling microscope. Zeitschrift für Physik B Condensed Matter 72, 497–501 (1988).

Sass, J. K. & Gimzewski, J. K. Proposal for the simulation of electrochemical charge transfer in the scanning tunneling microscope. Journal of electroanalytical chemistry and interfacial electrochemistry 251, 241–245 (1988).

Reihl, B. & Gimzewski, J. K. Field emission scanning Auger microscope (FESAM). Surface Science 189, 36–43 (1987).

Bednorz, J. G., Gimzewski, J. K. & Reihl, B. Field-emission scanning auger electron microscope. (1987).

Gimzewski, J. K. & Pohl, W. D. Scanning tunneling microscope. (1987).

Gimzewski, J. K., Stoll, E. & Schlittler, R. R. Scanning tunneling microscopy of individual molecules of copper phthalocyanine adsorbed on polycrystalline silver surfaces. Surface Science 181, 267–277 (1987).

Gimzewski, J. K. & Möller, R. Transition from the tunneling regime to point contact studied using scanning tunneling microscopy. Physical Review B 36, 1284 (1987).

Gimzewski, J. K., Möller, R., Pohl, D. W. & Schlittler, R. R. Transition from tunneling to point contact investigated by scanning tunneling microscopy and spectroscopy. Surface Science 189, 15–23 (1987).

Dürig, U., Gimzewski, J. K. & Pohl, D. W. Experimental observation of forces acting during scanning tunneling microscopy. Physical review letters 57, 2403 (1986).

Dürig, U., Gimzewski, J. K., Pohl, D. W. & Schlittler, R. Force Sensing in Scanning Tunneling Microscopy. IBM, Rüschlikon 1 (1986).

Gimzewski, J. K. et al. Impurity recycling and retention on Au and C surfaces exposed to the scrape-off layer of the TCA tokamak. Journal of Vacuum Science & Technology A 4, 90–96 (1986).

Gimzewski, J. K. et al. Impurity recycling and retention on Au and C surfaces exposed to the scrape-off layer of the TCA tokamak. Journal of Vacuum Science & Technology A 4, 90–96 (1986).

Gimzewski, J. K., Humbert, A., Pohl, D. W. & Veprek, S. Scanning tunneling microscopy of nanocrystalline silicon surfaces. Surface Science 168, 795–800 (1986).

Gimzewski, J. K. & Humbert, A. Scanning tunneling microscopy of surface microstructure on rough surfaces. IBM journal of research and development 30, 472–477 (1986).

Pohl, D. W., Gimzewski, J. K., Humbert, A. & Vepek, S. Surface Topography Studies Of Nanocrystalline Si by STM. 29th Annual Technical Symposium 98–101 (International Society for Optics and Photonics, 1986).

Reihl, B., Gimzewski, J. K., Nicholls, J. M. & Tosatti, E. Unoccupied electronic states of graphite as probed by inverse-photoemission and tunneling spectroscopy. Physical Review B 33, 5770 (1986).

Gimzewski, J. K., Humbert, A., Bednorz, J. G. & Reihl, B. A comparative study of coldly-and warmly-condensed Ag films by scanning tunneling microscopy. Surface Science 162, 961–964 (1985).

Humbert, A., Gimzewski, J. K. & Reihl, B. Postannealing of coldly condensed Ag films: Influence of pyridine preadsorption. Physical Review B 32, 4252 (1985).

Gimzewski, J. K., Humbert, A., Pohl, D. W. & Vepfek, S. A SCANNING TUNNELING MICROSCOPIC (STM) STUDY OF THE SURFACE TOPOGRAPHY OF PLASMA-DEPOSITED NANOCRYSTALLINE SILICON. (1985).

Gimzewski, J. K., Humbert, A., Bednorz, J. G. & Reihl, B. Silver films condensed at 300 and 90 K: scanning tunneling microscopy of their surface topography. Physical review letters 55, 951 (1985).

Haak, H. W., Sawatzky, G. A., Ungier, L., Gimzewski, J. K. & Thomas, T. D. Core-level electron–electron coincidence spectroscopy. Review of scientific instruments 55, 696–711 (1984).

Yamashita, K., Gimzewski, J. K. & Veprek, S. Hydrogen trapping in zirconium under plasma conditions. Journal of Nuclear Materials 128, 705–707 (1984).

Gimzewski, J. K. et al. Impurity deposition profiles in the plasma edge of the TCA Tokamak. Physica Scripta 30, 271 (1984).

Gimzewski, J. K. & Veprek, S. Investigation of impurity retention, implantation and sputtering phenomena on au and c surfaces exposed to the scrape-off-layer. Journal of Nuclear Materials 128, 703–704 (1984).

Gimzewski, J. K. & Veprek, S. A novel method for the determination of the energies of impurity ions bombarding a solid surface exposed to a low pressure plasma. Journal of Vacuum Science & Technology A 2, 35–39 (1984).

Hofmann, F. et al. Scrape-off measurements during Alfvén wave heating in the TCA tokamak. Journal of Nuclear Materials 121, 22–28 (1984).

Gimzewski, J. K. & Veprek, S. DETERMINATION OF THE ENERGIES OF IMPURITY IONS IN A LOW-PRESSURE PLASMA USING PLASMA CHEMICAL ETCHING. HELVETICA PHYSICA ACTA 56, 959–960 (BIRKHAUSER VERLAG AG PO BOX 133 KLOSTERBERG 23, CH-4010 BASEL, SWITZERLAND, 1983).

Bomben, K. D., Gimzewski, J. K. & Thomas, T. D. Extra-atomic relaxation in HCl, ClF, and Cl2 from x-ray photoelectron spectroscopy. The Journal of Chemical Physics 78, 5437–5442 (1983).

Gimzewski, J. K. & Veprek, S. Investigation of the initial stages of oxidation of microcrystalline silicon by means of X-ray photoelectron spectroscopy. Solid state communications 47, 747–751 (1983).

Veprek, S. et al. Properties of microcrystalline silicon. IV. Electrical conductivity, electron spin resonance and the effect of gas adsorption. Journal of Physics C: Solid State Physics 16, 6241 (1983).

Gimzewski, J. K. et al. Scrape-off measurements during Alfvén wave heating in the TCA tokamak. (1983).

Groner, P., Gimzewski, J. K. & Veprek, S. BORON AND DOPED BORON 1ST WALL COATINGS BY PLASMA CVD. JOURNAL OF NUCLEAR MATERIALS 103, 257–260 (1982).