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Gimzewski, J. K. Room temperature molecular recognition and manipulation on an individual basis. EUROPEAN JOURNAL OF CELL BIOLOGY 74, 9–9 (WISSENSCHAFTLICHE VERLAG MBH BIRKENWALDSTRASSE 44, POSTFACH 10 10 61, 70009 STUTTGART, GERMANY, 1997).

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Dumas, P. et al. Optical Properties of Low Dimensional Silicon Structures 157–162 (Springer Netherlands, 1993).

Gimzewski, J. K. Scanning tunneling and local probe studies of fullerenes. NATO ASI Series E Applied Sciences-Advanced Study Institute 316, 117–138 (1996).

Gimzewski, J. K. & Pohl, W. D. Scanning tunneling microscope. (1987).

Nagaoka, K., Wesoloski, L. M., Gimzewski, J. K., Aono, M. & Nakayama, T. Scanning tunneling microscope study of a local electronic state surrounding Mn nanoclusters on graphite. Japanese journal of applied physics 45, L469 (2006).

Gimzewski, J. K., Humbert, A., Pohl, D. W. & Vepfek, S. A SCANNING TUNNELING MICROSCOPIC (STM) STUDY OF THE SURFACE TOPOGRAPHY OF PLASMA-DEPOSITED NANOCRYSTALLINE SILICON. (1985).

Gimzewski, J. K. Scanning tunneling microscopic techniques applied to roughness of silver surfaces. 1988 Intl Congress on Optical Science and Engineering 274–280 (International Society for Optics and Photonics, 1989).

Gimzewski, J. K. Scanning tunneling microscopy. Le Journal de Physique IV 3, C7–41 (1993).

Cuberes, M. T., Schlittler, R. R., Jung, T. A., Schaumburg, K. & Gimzewski, J. K. A scanning tunneling microscopy investigation of 4, 4′-dimethylbianthrone molecules adsorbed on Cu (111). Surface science 383, 37–49 (1997).

Gimzewski, J. K., Jung, T. A., Cuberes, M. T. & Schlittler, R. R. Scanning tunneling microscopy of individual molecules: beyond imaging. Surface science 386, 101–114 (1997).

Gimzewski, J. K., Stoll, E. & Schlittler, R. R. Scanning tunneling microscopy of individual molecules of copper phthalocyanine adsorbed on polycrystalline silver surfaces. Surface Science 181, 267–277 (1987).

Gimzewski, J. K., Humbert, A., Pohl, D. W. & Veprek, S. Scanning tunneling microscopy of nanocrystalline silicon surfaces. Surface Science 168, 795–800 (1986).

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Gimzewski, J. K. & Humbert, A. Scanning tunneling microscopy of surface microstructure on rough surfaces. IBM journal of research and development 30, 472–477 (1986).

Gimzewski, J. K. & Humbert, A. Scanning tunneling microscopy of surface microstructure on rough surfaces. SPIE MILESTONE SERIES MS 107, 249–249 (1995).

Gimzewski, J. K. Electron crystallography of organic molecules 203–215 (Springer Netherlands, 1991).

Berndt, R., Baratoff, A. & Gimzewski, J. K. Scanning Tunneling Microscopy and Related Methods 269–280 (Springer Netherlands, 1990).

Gimzewski, J. K., Berndt, R. & Schlittler, R. R. Scanning-tunneling-microscope study of antiphase domain boundaries, dislocations, and local mass transport on Au (110) surfaces. Physical Review B 45, 6844 (1992).

Hofmann, F. et al. Scrape-off measurements during Alfvén wave heating in the TCA tokamak. Journal of Nuclear Materials 121, 22–28 (1984).

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Gimzewski, J. K., Humbert, A., Bednorz, J. G. & Reihl, B. Silver films condensed at 300 and 90 K: scanning tunneling microscopy of their surface topography. Physical review letters 55, 951 (1985).

Schlittler, R. R. et al. Single crystals of single-walled carbon nanotubes formed by self-assembly. Science 292, 1136–1139 (2001).

Joachim, C. & Gimzewski, J. Kazimiez. Molecular Machines and Motors 1–18 (Springer Berlin Heidelberg, 2001).

Hsueh, C., Reed, J. & Gimzewski, J. K. Single molecule gene expression profiling using atomic force microscopy. ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY 241, (AMER CHEMICAL SOC 1155 16TH ST, NW, WASHINGTON, DC 20036 USA, 2011).

Reed, J. et al. Single molecule transcription profiling with AFM. Nanotechnology 18, 044032 (2007).

Gimzewski, J. K. Single-Wall Carbon Nanotube Crystals. APS Meeting Abstracts 1, 25001 (2002).

Schaffner, M. - H. et al. Size-dependent light emission from mass-selected clusters. The European Physical Journal D-Atomic, Molecular, Optical and Plasma Physics 2, 79–82 (1998).

Sass, J. K. & Gimzewski, J. K. Solvent dynamical effects in scanning tunneling microscopy with a polar liquid in the gap. Journal of electroanalytical chemistry and interfacial electrochemistry 308, 333–337 (1991).

Murrell, M. P. et al. Spatially resolved electrical measurements of SiO2 gate oxides using atomic force microscopy. Applied physics letters 62, 786–788 (1993).