Publications

Found 168 results
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Stieg, A. Z., Rasool, H. I. & Gimzewski, J. K. A flexible, highly stable electrochemical scanning probe microscope for nanoscale studies at the solid-liquid interface. Review of Scientific Instruments 79, 103701 (2008).
Dürig, U., Gimzewski, J. K., Pohl, D. W. & Schlittler, R. Force Sensing in Scanning Tunneling Microscopy. IBM, Rüschlikon 1 (1986).
Loppacher, C. et al. Forces with submolecular resolution between the probing tip and Cu-TBPP molecules on Cu (100) observed with a combined AFM/STM. Applied Physics A 72, S105–S108 (2001).
Stoll, E. P. & Gimzewski, J. K. Fundamental and practical aspects of differential scanning tunneling microscopy. Journal of Vacuum Science & Technology B 9, 643–647 (1991).
Tang, H., Cuberes, M. T., Joachim, C. & Gimzewski, J. K. Fundamental considerations in the manipulation of a single C< sub> 60 molecule on a surface with an STM. Surface science 386, 115–123 (1997).
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Yamashita, K., Gimzewski, J. K. & Veprek, S. Hydrogen trapping in zirconium under plasma conditions. Journal of Nuclear Materials 128, 705–707 (1984).
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Reed, J. et al. Identifying individual DNA species in a complex mixture by precisely measuring the spacing between nicking restriction enzymes with atomic force microscope. Journal of The Royal Society Interface 9, 2341–2350 (2012).
Gimzewski, J. K. et al. Impurity deposition profiles in the plasma edge of the TCA Tokamak. Physica Scripta 30, 271 (1984).
Gimzewski, J. K. et al. Impurity recycling and retention on Au and C surfaces exposed to the scrape-off layer of the TCA tokamak. Journal of Vacuum Science & Technology A 4, 90–96 (1986).
Sharma, S. et al. Influence of substrates on hepatocytes: a nanomechanical study. Journal of Scanning Probe Microscopy 4, 7–16 (2009).
Berndt, R. & Gimzewski, J. K. Injection luminescence from CdS (112{\={}} 0) studied with scanning tunneling microscopy. Physical Review B 45, 14095 (1992).
Berger, R. et al. Integration of silicon micromechanical arrays with molecular monolayers for miniaturized sensor systems. Sensors and Their Applications VIII, Proceedings of the eighth conference on Sensors and their Applications, held in Glasgow, UK, 7-10 September 1997 7, 71 (1997).
Gimzewski, J. K., Donnelly, T. & Affrossman, S. Interaction of ozone with nickel ions adsorbed on alumina. Journal of Catalysis 47, 79–84 (1977).
Reed, J., Schmit, J., Han, S., Wilkinson, P. & Gimzewski, J. K. Interferometric profiling of microcantilevers in liquid. Optics and Lasers in Engineering 47, 217–222 (2009).
Gaisch, R. et al. Internal structure of C60 fullerence molecules as revealed by low-temperature STM. Applied Physics A 57, 207–210 (1993).
Gaisch, R. et al. Internal structure of C60 on Au (110) as observed by low-temperature scanning tunneling microscopy. Journal of Vacuum Science & Technology B 12, 2153–2155 (1994).
Gimzewski, J. K. & Veprek, S. Investigation of impurity retention, implantation and sputtering phenomena on au and c surfaces exposed to the scrape-off-layer. Journal of Nuclear Materials 128, 703–704 (1984).
Gimzewski, J. K. & Veprek, S. Investigation of the initial stages of oxidation of microcrystalline silicon by means of X-ray photoelectron spectroscopy. Solid state communications 47, 747–751 (1983).
Gimzewski, J. K. et al. Investigations of the surface of the amorphous alloy Fe< sub> 80 B< sub> 20 by STM, XPS and AES. Journal of non-crystalline solids 116, 253–261 (1990).
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Murray, P. W. et al. l-> 3 DIMENSIONAL STRUCTURES ON A UNI-DIRECTION AL SUBSTRATE. (1995).
Gimzewski, J. K., Berndt, R. & Schlittler, R. R. Nanosources and Manipulation of Atoms Under High Fields and Temperatures: Applications 219–228 (Springer Netherlands, 1993).
Gimzewski, J. K., Berndt, R. & Schlittler, R. R. Local Experiments Using Nanofabricated Structures in STM. NATO ASI SERIES E APPLIED SCIENCES 235, 219–219 (1993).
Reihl, B., Coombs, J. H. & Gimzewski, J. K. Local inverse photoemission with the scanning tunneling microscope. Surface Science 211, 156–164 (1989).
Reihl, B. et al. Low-temperature scanning tunneling microscopy. Physica B: Condensed Matter 197, 64–71 (1994).
Gaisch, R. et al. Low-temperature ultra-high-vacuum scanning tunneling microscope. Ultramicroscopy 42, 1621–1626 (1992).
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Cuberes, M. T., Schlittler, R. R. & Gimzewski, J. K. Manipulation of C 60 molecules on Cu (111) surfaces using a scanning tunneling microscope. Applied Physics A: Materials Science & Processing 66, S669–S673 (1998).
Jr, J. T. Yates et al. Materials index. Surface Science 386, 351–354 (1997).
Gimzewski, J. K., Jung, T., Cuberes, M. T., Schlittler, R. R. & Joachim, C. Micro/Nanotribology and Its Applications 299–309 (Springer Netherlands, 1997).
Meyer, E., Gimzewski, J. K., Gerber, C. & Schlittler, R. R. Ultimate Limits of Fabrication and Measurement 89–95 (Springer Netherlands, 1995).
Gimzewski, J. K., Gerber, C., Meyer, E. & Schlittler, R. R. Forces in Scanning Probe Methods 123–131 (Springer Netherlands, 1995).
Scandella, L. et al. Micromechanical Thermal Gravimetry Performed on one Single Zeolite Crystal. Helvetica Physica Acta 71, 3–4 (1998).
Berger, R. et al. Micromechanical thermogravimetry. Chemical Physics Letters 294, 363–369 (1998).
Fabian, J. - H. et al. Micro Total Analysis Systems’ 9 117–120 (Springer Netherlands, 1998).
Berger, R., Gerber, C., Lang, H. P. & Gimzewski, J. K. Micromechanics: A toolbox for femtoscale science:“Towards a laboratory on a tip”. Microelectronic engineering 35, 373–379 (1997).
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Dumas, P. et al. Nanostructuring of porous silicon using scanning tunneling microscopy. Journal of Vacuum Science & Technology B 12, 2067–2069 (1994).
Gimzewski, J. K. & Veprek, S. A novel method for the determination of the energies of impurity ions bombarding a solid surface exposed to a low pressure plasma. Journal of Vacuum Science & Technology A 2, 35–39 (1984).
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Gimzewski, J. K., Gerber, C., Meyer, E. & Schlittler, R. R. Observation of a chemical reaction using a micromechanical sensor. Chemical Physics Letters 217, 589–594 (1994).
Gimzewski, J. K., Modesti, S., Gerber, C. & Schlittler, R. R. Observation of a new Au (111) reconstruction at the interface of an adsorbed C< sub> 60 overlayer. Chemical physics letters 213, 401–406 (1993).
Gimzewski, J. K., Berndt, R. & Schlittler, R. R. Observation of local photoemission using a scanning tunneling microscope. Ultramicroscopy 42, 366–370 (1992).
Gimzewski, J. K., Berndt, R. & Schlittler, R. R. Observation of mass transport on Au (110)-(1$\times$ 2) reconstructed surfaces using scanning tunneling microscopy. Surface Science 247, 327–332 (1991).
Gimzewski, J. K., Berndt, R. & Schlittler, R. R. Observation of mass transport on Au (110)-(1$\times$ 2) reconstructed surfaces using scanning tunneling microscopy. Surface Science Letters 247, A213 (1990).
Reed, J., Wilkinson, P., Schmit, J., Klug, W. & Gimzewski, J. K. Observation of nanoscale dynamics in cantilever sensor arrays. Nanotechnology 17, 3873 (2006).
Naranjo, B., Gimzewski, J. K. & Putterman, S. E. T. H. Observation of nuclear fusion driven by a pyroelectric crystal. Nature 434, 1115–1117 (2005).
Gimzewski, J. K., Berndt, R. & Schlittler, R. R. Observation of the temporal evolution of the (1 times 2) reconstructed Au (110) surface using scanning tunneling microscopy. Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena;(United States) 9, (Submitted).
Gimzewski, J. K., Berndt, R. & Schlittler, R. R. Observation of the temporal evolution of the (1$\times$ 2) reconstructed Au (110) surface using scanning tunneling microscopy. Journal of Vacuum Science & Technology B 9, 897–901 (1991).
Jung, T., Schlittler, R., Gimzewski, J. K. & Himpsel, F. J. One-dimensional metal structures at decorated steps. Applied Physics A 61, 467–474 (1995).
Gimzewski, J. K. et al. Near Field Optics 333–340 (Springer Netherlands, 1993).
Gimzewski, J. K., Affrossman, S., Gibson, M. T., Watson, L. M. & Fabian, D. J. Oxidation of scandium by oxygen and water studied by XPS. Surface Science 80, 298–305 (1979).
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Schmit, J., Reed, J., Novak, E. & Gimzewski, J. K. Performance advances in interferometric optical profilers for imaging and testing. Journal of Optics A: Pure and Applied Optics 10, 064001 (2008).
Gimzewski, J. K., VATEL, O. & Hallimaoui, A. Ph. DUMAS*, M. GU*, C. SYRYKH*, F. SALVAN*,* GPEC, URA CNRS 783, Fac. de Luminy, 13288, Marseille Cedex 9, France. Optical Properties of Low Dimensional Silicon Structures: Proceedings of the NATO Advanced Research Workshop, Meylan, France, March 1-3, 1993 244, 157 (1993).

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