Publications

Found 67 results
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Pohl, D. W., Gimzewski, J. K., Humbert, A. & Vepek, S. Surface Topography Studies Of Nanocrystalline Si by STM. 29th Annual Technical Symposium 98–101 (International Society for Optics and Photonics, 1986).
Sharma, S. et al. Structural-mechanical characterization of nanoparticle exosomes in human saliva, using correlative AFM, FESEM, and force spectroscopy. ACS nano 4, 1921–1926 (2010).
Schaffner, M. - H. et al. Size-dependent light emission from mass-selected clusters. The European Physical Journal D-Atomic, Molecular, Optical and Plasma Physics 2, 79–82 (1998).
Reed, J. et al. Single molecule transcription profiling with AFM. Nanotechnology 18, 044032 (2007).
Pelling, A. E. et al. Self-organized and highly ordered domain structures within swarms of Myxococcus xanthus. Cell motility and the cytoskeleton 63, 141–148 (2006).
Gimzewski, J. K. et al. Scrape-off measurements during Alfvén wave heating in the TCA tokamak. (1983).
Hofmann, F. et al. Scrape-off measurements during Alfvén wave heating in the TCA tokamak. Journal of Nuclear Materials 121, 22–28 (1984).
Gimzewski, J. K., Humbert, A., Pohl, D. W. & Veprek, S. Scanning tunneling microscopy of nanocrystalline silicon surfaces. Surface Science 168, 795–800 (1986).
Gimzewski, J. K., Humbert, A., Pohl, D. W. & Vepfek, S. A SCANNING TUNNELING MICROSCOPIC (STM) STUDY OF THE SURFACE TOPOGRAPHY OF PLASMA-DEPOSITED NANOCRYSTALLINE SILICON. (1985).
Gimzewski, J. K. & Pohl, W. D. Scanning tunneling microscope. (1987).
Pohl, D. W. & Gimzewski, J. K. Scanning near-field microscopies. 15th Int'l Optics in Complex Sys. Garmisch, FRG 480–484 (International Society for Optics and Photonics, 1990).
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Sharma, S. et al. Influence of substrates on hepatocytes: a nanomechanical study. Journal of Scanning Probe Microscopy 4, 7–16 (2009).
Reed, J., Walczak, W. J., Petzold, O. N. & Gimzewski, J. K. In situ mechanical interferometry of matrigel films. Langmuir 25, 36–39 (2008).
Gimzewski, J. K. et al. Impurity recycling and retention on Au and C surfaces exposed to the scrape-off layer of the TCA tokamak. Journal of Vacuum Science & Technology A 4, 90–96 (1986).
Gimzewski, J. K. et al. Impurity deposition profiles in the plasma edge of the TCA Tokamak. Physica Scripta 30, 271 (1984).
Sundstrom, A. et al. Image Analysis and Length Estimation of Biomolecules Using AFM. Information Technology in Biomedicine, IEEE Transactions on 16, 1200–1207 (2012).

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